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JPH0329324A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1989-06-26
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Granted: —
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Expires: 2009-06-26
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Abstract

Abstract PURPOSE:To take measures to prevent dust particles from being produced by means of a simple method and in a short time and to enhance a productivity by a method wherein, after an insulating film or a conductive film on a substrate has been etched or after an insulating film or a conductive film on a substrate has been formed inside a chamber provided with an adhesion-preventive sheet, a coating film whose close contact property is good is formed on the insulating film or the conductive film which has adhered to the adhesion- preventive sheet. CONSTITUTION:After an insulating film or a conductive film on a substrate 6 has been etched, or after an insulating film or a conductive film has been formed on a substrate 6, particles which are the same as particles of the etched film or particles of the formed film adhere to the surface of an adhesion-preventive sheet 5; a film composed of the particles is formed on the adhesion-preventive sheet 5. However, since a coating film 8 whose close contact property with the film is good is formed on the film, the film which has adhered to the adhesion-preventive sheet 5 is covered with and fixed to the coating film 8. As a result, it is possible to restrain the film adhered to the adhesion-preventive sheet 5 from being exfoliated; it is possible to prevent dust particles from being produced from the adhesion-preventive sheet 5. Thereby, it is possible to take measures to prevent the dust particles from being produced by means of a simples method and in a short time.

Inventors

  • 👤 Norihiro Kabei
  • 👤 壁井 則広

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 03:02
CPC Classifications
—

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