Measuring apparatus for input threshold of ic

Abstract

Abstract PURPOSE:To enable measurement of an output state of a terminal without being examined with a higher measuring accuracy by applying an analog sweep voltage dropping gradually after a gradual rise to an input terminal of an IC to monitor a current flowing through a power source terminal of the IC. CONSTITUTION:As a sweep voltage generation circuit 1 generates analog sweep voltage waveform S with a passage of time, an input voltage VIN of a DUT 6 rises linearly. When the input voltage exceeds an input threshold voltage of an input circuit of the DUT6, an internal circuit receiving the input operates. At this point, current flows transiently and appears as a characteristic graph P of a current IDD. This static consumption current IDD is monitored with a peak current detection circuit 8 and when this exceeds a comparison reference current level ITH, it means that this surpasses an input threshold. So, a peak detection signal D is generated at time T1 from the circuit 8 and the circuit 1 receiving the signal stops sweeping. The current voltage value is measured with a voltage value measuring circuit 7 through a switching circuit 5. This is taken into a measurement control circuit 10 receiving the signal D as results of measurement.

Inventors

• 👤 Yoshihiko Ito
• 👤 仁彦 伊藤

Bibliographic Details