Eddy current flaw detecting device for long-sized material

Abstract

Abstract PURPOSE:To hold the gap between a probe and an inspection surface constant against a curvature of a material to be inspected by displacing an inspection surface profile roller according to the curvature of the material to be inspected and rotating a slanting table into parallel relation with the material to be inspected. CONSTITUTION:Inspection surface profile rollers 37 and 38 are provided in contact with the inspection surface of the material to be inspected. The rollers 37 and 38 are arranged at a lengthwise interval and the roller 37 is supported by a probe support unit 19 which moves to contact and leave the inspection surface of the material to be inspected. Further, the roller 38 is fitted to the slanting table 21, which is provided to the unit 19 rotatably around the installation position of the roller 37 as a fulcrum so as to contact and leave the inspection surface of the material to be inspected and is pressed against the material to be inspected with a spring force. The slanting table 21 supports an eddy current flaw detection probe as well. Then, since the slanting table 21 rotates into the parallel relation with the material to be inspected as the rollers 37 and 38 are displaced owing to the curvature of the material to be inspected, the gap between the probe supported by the slanting table 21 and the inspection surface never varies.

Inventors

• 👤 Akira Ogawa
• 👤 小川　旭
• 👤 Kiyohiro Terao
• 👤 寺尾　精太
• 👤 Tomoo Hotta
• 👤 知夫 堀田
• 👤 Yasuhiro Yoshida
• 👤 泰洋 吉田
• 👤 Noboru Seike
• 👤 清家　昇
• 👤 Hiroyoshi Koyanagi
• 👤 小柳　裕義

Bibliographic Details