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JPH02230773A Expired / Lapsed JP ⏱️ 0.0 years remaining

Thin film transistor element array

Assignee: NEC Corp
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Filing: 1989-03-03
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Granted: —
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Expires: 2009-03-03
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Abstract

Abstract PURPOSE:To obtain a thin film transistor element array whose gate leak current is small by forming enbloc a gate insulating film on the whole surface of a substrate. CONSTITUTION:After a source electrode 10 and a drain electrode 11 are formed on a substrate 3, the pattern thin film of an a-Si:H film as a semiconductor layer 9 is formed by photochemically decomposing disilane gas with ArF laser 1. Then the glass substrate 3 is carried into a CVD chamber 7, and an SiN film is subjected to plasma CVD using silane and ammonia as material gas, thereby forming a gate insulating film 12. By sputtering, a chromium film is formed on the glass substrate 3, and a gate electrode 13 is formed by patterning. An element array of this structure is almost free from leak current from a gate electrode, and excellent element operation is realized for a long time.

Inventors

  • 👤 Yuko Hiura
  • 👤 樋浦 祐子

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 03:32
CPC Classifications
—

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