Ultrasonic flaw detecting system

Abstract

Abstract PURPOSE:To improve the distance resolution by scanning a frequency and processing a receiving signal from a material to be inspected in each frequency, collecting the data from a defect and performing a frequency synthesis processing. CONSTITUTION:A signal which has been transmitted from a probe 3 is reflected by a defect 2 and the bottom face of a material to be inspected 1, and received by the probe 3. The received signal is squared by an arithmetic means 8a, and a signal obtained by the square is allowed to pass through a low-pass filter 8b and a DC component is fetched, and it is stored together with a transmitting frequency in a storage means 8c. Said processing is executed repeatedly by a signal processor 8, while scanning successively a transmitting frequency of a frequency variable transmitter 7. By a period detecting means 8d, a period of the stored signal is detected by a frequency synthesis processing of a frequency scanning range, and from the detected period, a position of the defect in the material to be inspected is detected.

Inventors

• 👤 Shiyuuzou Wadaka
• 👤 修三 和高
• 👤 Koichiro Misu
• 👤 幸一郎 三須
• 👤 Tsutomu Nagatsuka
• 👤 勉 永塚

Bibliographic Details