Patent JP3233879B2 successfully refreshed from Google Patents.
JP3233879B2
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Probe for flaw detection
Assignee: Mitsubishi Heavy Industries Ltd
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Filing: 1997-08-20
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Granted: 2001-12-04
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Expires: 2017-08-20
Abstract
No abstract record available.
Inventors
- 👤 精一 若山
Bibliographic Details
Application Number
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Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-02 10:09
CPC Classifications
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