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JP2000200745A Expired / Lapsed JP ⏱️ 0.0 years remaining

Projection exposure equipment

Assignee: Nikon Corp
•
Filing: 1999-01-07
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Granted: —
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Expires: 2019-01-07
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Abstract

Abstract Translated from Japanese (57)【要約】 【課題】 感光剤を塗布した基板に高エネルギの露光光 を照射した際にも、投影光学系等に微粒子が付着して汚 染されることを防止する。 【解決手段】 感光剤Kを塗布した基板Wに、露光光B によりマスクのパターンを投影露光する投影露光装置に おいて、露光光Bを透過させるとともに、基板Wの感光 剤塗布面18を少なくとも収納するチャンバ15を備え る。 [PROBLEMS] To prevent contamination of a projection optical system or the like due to fine particles even when a substrate coated with a photosensitive agent is irradiated with high-energy exposure light. SOLUTION: Exposure light B is applied to a substrate W coated with a photosensitive agent K. In the projection exposure apparatus for projecting and exposing a pattern of a mask, a chamber 15 for transmitting exposure light B and accommodating at least a photosensitive agent application surface 18 of the substrate W is provided.

Inventors

  • 👤 Hitoshi Takeuchi
  • 👤 仁 竹内

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 15:46
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/708; G03F7/70908; G03F7/70916; G03F7/70808; G03F7/70983

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