PERIPHERAL DEVICE LOGIC ADAPTER TEST DEVICE CONNECTED TO AN INFORMATION PROCESSING UNIT

Abstract

Abstract The testing device is used for a logic adaptor of a data processor peripheral unit, the latter being connected to the processor via a peripheral controller, with binary test elements and a test command element entered into the real memory of the controller. MEans are provided for addressing the controller memory, to obtain the binary test elements and the test command elements on the one hand and the binary test result elements on the other. An interpreting unit is connected to the memory for decoding and executing the binary test command elements. The logic adaptor to be tested can be disconnected from the other parts of the corresponding peripheral unit under the control of the test command elements, via the interpreting unit.

Inventors

• 👤 Marcel Rene Rottier

Bibliographic Details