Device for deforming electron microscope samples - has strain gauge and oppositely moving supports on motor driven screw

Abstract

Abstract The device is for deforming samples of materials while they are being observed by a scanning electron microscope and comprises a base plate (1) supporting on one side a damper (5) on which is mounted an interchangeable reduction gear and electric motor unit (7) via a coupling (8) and extended on the other side by a plate (11) on which two cross-pieces (13, 15) run in opposite directions guided by two axles (17, 19) and a double threaded master screw (21). The cross-pieces hold the sample, one (13) directly and the other (15) through the intermediary of a strain gauge (25). The device is for studies of fracture propagation, development of slip lines in grain structures, etc.

Inventors

No inventors recorded.

Bibliographic Details