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FR2201763A5
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Monitoring surface treatment - e.g. anodising, by infra red emission or reflexion metering
Assignee: QUILCAILLE JACQUES
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Filing: 1972-09-29
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Granted: 1974-04-26
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Expires: 1992-09-29
Abstract
Abstract Analysis of treated surfaces e.g. of metals, comprises measuring the surface temperature with a radiation meter and comparing the resulting measurement with that from a reference sample.
Inventors
No inventors recorded.
Bibliographic Details
Application Number
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Jurisdiction
FR
Data Source
google_patents
Last Synchronized
2026-11-08 08:55
CPC Classifications
G; G01; G01J; G01J5/00; G01J5/0003
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