Patent EP0822452A2 successfully refreshed from Google Patents.
EP0822452A2
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Optical proximity correction method and apparatus
Assignee: LSI Corp
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Filing: 1997-02-26
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Granted: —
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Expires: 2017-02-26
Abstract
Abstract A photolithography optical proximity correction method for mask layouts (e.g., reticle masks) is disclosed. The method includes performing pattern recognition on a layout design to identify locations of feature edges with respect to other feature edges in the layout design. The method further includes obtaining an optical proximity correction for at least one of the feature edges by evaluating one or more non-linear mathematical expressions for optical proximity correction at the location of that edge with respect to other feature edges. <IMAGE>
Inventors
- 👤 Mario Garza
- 👤 Nicholas K. Eib
- 👤 Keith K. Chao
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-07 11:03
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70425; G03F7/70433; G03F7/70441; G03F1/00; G03F1/36
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
92 words
All optical proximity correction method for preparing reticle designs to
be used in photolithography, the method comprising the following steps: (a) performing pattern recognition on an integrated circuit layout design to
identify a location of a selected feature edge in the layout design; (b) obtaining an optical proximity correction value for said selected feature
edge by evaluating one or more non-linear mathematical expressions for optical
proximity correction at the location of the selected feature edge; and (c) incorporating said optical proximity correction value into said layout
design to form said reticle design.
Claim 2
Dependent Claim
77 words
The optical proximity correction method of claim 1, further comprising
the following steps: repeating steps (a) through (c) for multiple feature edges in said layout design; for each feature edge located in step (a), determining whether the selected
feature edge is associated with a feature having a critical dimension above a pre-selected
value; for any feature edge found to be associated with a feature having a critical
dimension above said pre-selected value, skipping steps (b) and (c).
Claim 3
Dependent Claim
18 words
The optical proximity correction method of claim 2 wherein the preselected
value is about 0.5 µm or greater;
Claim 4
Dependent Claim
34 words
The optical proximity correction method of claim 1, wherein said step of
obtaining an optical proximity correction includes a step of evaluating said one of said
non-linear mathematical expressions by directly solving said expression.
Claim 5
Dependent Claim
46 words
The optical proximity correction method of claim 1, wherein said step of
obtaining an optical proximity correction includes a step of evaluating said one of said
non-linear mathematical expressions by employing a look-up table of discreet optical
proximity correction values generated from said non-linear mathematical expression.
Claim 6
Dependent Claim
70 words
The optical proximity correction method of claim 1, wherein the one or
more non-linear mathematical expressions are evaluated at locations of the selected
feature edges, which locations are provided as combinations of at least (i) one value
representing the width of a light transmitting region adjacent to the selected feature
edge, and (ii) a second value representing a width of a light blocking region adjacent to
the selected feature edge.
Claim 7
Dependent Claim
29 words
The optical proximity correction method of claim 1, further comprising
a step of confirming the optical proximity correction value obtained in step (b) against
one or more predetermined rules.
Claim 8
Independent Claim
83 words
An apparatus for performing optical proximity correction on layout
designs to be used in photolithography, the apparatus comprising: (a) means for performing pattern recognition on an integrated circuit layout
design to identify locations of selected feature edges in the layout design; and (b) means for obtaining an optical proximity correction value for at least one
of said selected feature edges by evaluating one or more non-linear mathematical
expressions for optical proximity correction at the location of said at least one selected
feature edge.
Claim 9
Dependent Claim
69 words
The apparatus for performing optical proximity correction of claim 8,
further comprising means for determining whether the selected feature edges are
associated with features having a critical dimension of at most about a predefined value,
wherein when said means for determining finds that a particular feature edge is
associated with a feature having a critical dimension greater than said predefined value,
an optical proximity correction value is not obtained.
Claim 10
Dependent Claim
32 words
The apparatus for performing optical proximity correction of claim 8,
wherein said means for obtaining an optical proximity correction value evaluates one of
said non-linear mathematical expressions by directly solving said expression.
Claim 11
Dependent Claim
45 words
The apparatus for performing optical proximity correction of claim 8,
wherein said means for obtaining an optical proximity correction evaluates said one of
said non-linear mathematical expressions by employing a look up table of discreet
optical proximity correction values generated from said non-linear mathematical
expression.
Claim 12
Dependent Claim
58 words
The apparatus for performing optical proximity correction of claim 8,
wherein the locations of the feature edges are provided as at least (i) one value
representing a width of a light transmitting region adjacent to the selected feature edge,
and (ii) a second value representing a width of a light blocking region adjacent to the
selected feature edge.
Claim 13
Dependent Claim
34 words
The apparatus for performing optical proximity correction of claim 8,
wherein the means for obtaining an optical proximity correction confirms the optical
proximity correction value it obtains against one or more of predetermined rules.
Claim 14
Dependent Claim
107 words
A reticle design for use in photolithography, the reticle design having a
pattern of light transmitting and light blocking regions specified at least in part by a
non-linear proximity correction method comprising the following steps: (a) performing pattern recognition on an integrated circuit layout design to
identify a location of a selected feature edge in the layout design; (b) obtaining an optical proximity correction value for said selected feature
edge by evaluating one or more non-linear mathematical expressions for optical
proximity correction at the location of the selected feature edge; and (c) incorporating said optical proximity correction value into said layout
design to form said reticle design.
Claim 15
Dependent Claim
83 words
The reticle design of claim 14, wherein the method of preparing the
reticle design further comprises the following steps: repeating steps (a) through (c) for multiple feature edges in said layout design; for each feature edge located in step (a), determining whether the selected
feature edge is associated with a feature having a critical dimension above a pre-selected
value; for any feature edge found to be associated with a feature having a critical
dimension above said pre-selected value, skipping steps (b) and (c).
Claim 16
Dependent Claim
68 words
The reticle design of claim 14, wherein the one or more non-linear
mathematical expressions are evaluated at locations of the selected feature edges, which
locations are provided as combinations of at least (i) one value representing the width of
a light transmitting region adjacent to the selected feature edge, and (ii) a second value
representing a width of a light blocking region adjacent to the selected feature edge.
Claim 17
Dependent Claim
35 words
The reticle design of claim 14, wherein the method of preparing the
reticle design further comprises a step of confirming the optical proximity correction
value obtained in step (b) against one or more predetermined rules.
References Cited (Backward Citations)
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