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EP0595080A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Low-loss strip-loaded optical waveguide

Assignee: International Business Machines Corp
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Filing: 1993-10-06
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Granted: —
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Expires: 2013-10-06
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Abstract

Abstract An optical waveguide is described incorporating a semiconductor substrate, a layer of silicon formed thereover, a layer of Si 1- x Ge x or Si 1- x - y Ge x C y formed thereover for carrying optical radiation, and a layer of silicon or other material having a different index of refraction formed over the layer for carrying the radiation and is patterned to define the waveguide below thick areas and patterned to have thin areas elsewhere to provide a capping layer. The invention overcomes the problem of attenuation due to sidewall surfaces and interfaces normally used to define the lateral dimension of the waveguide.

Inventors

  • 👤 Jean-Marc Halbout
  • 👤 Subramanian Srikanteswara Iyer
  • 👤 Vijay Panchapa Kesan
  • 👤 George Victor Treyz

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-03 21:44
CPC Classifications
G; G02; G02B; G02B6/00; G02B6/10; G02B6/12; G02B6/13; G02B6/132; G02B6/122; G02B6/134; G02B6/1347

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 98 words
A waveguide (10) for carrying optical radiation comprising: a substrate (12), a first layer (18) of silicon formed over said substrate (12), a second layer (22) of a material selected from the group consisting of Si 1- x Ge x and Si 1- x - y Ge x C y formed over said first layer of silicon (18), and a third layer (26) of material formed over said second layer (22) having a first thickness in first areas (29) where said waveguide (10) is desired and a second thickness in second areas (30) where no waveguide is desired.
Claim 2
Dependent Claim 25 words
The waveguide of claim 1, wherein said first layer (18) is an epitaxial layer having a thickness in the range from 10 nm to 5µm.
Claim 3
Dependent Claim 50 words
The waveguide of claim 1 or 2, wherein said second thickness in second areas (30) of said third layer (26) is in the range from 10 - 40 nm and wherein said first thickness in said first areas (29) of said third layer (26) is in the range from 3-5µm.
Claim 4
Dependent Claim 65 words
The waveguide of any of the preceding claims 1 to 3, wherein said second layer (22) has a thickness in the range from 2.8-4.2µm or in the range from 100 nm to 50µm and wherein the mole fraction x of germanium in said material of said second layer (22) is in the range from .012 to .018 or in the range from 0.01 to 0.90.
Claim 5
Dependent Claim 43 words
The waveguide of any of the preceding claims 1 to 4, wherein said substrate (12) includes a fourth layer (14) of SiO ₂ and a fifth layer (16) of single crystalline Si on its upper surface (17) and below said first layer (18).
Claim 6
Dependent Claim 56 words
The waveguide of any of the preceding claims 1 to 5, wherein said first areas (29) of said third layer (26) has a width in the range from 5 to 20µm or in the range from 15 to 200 µm and wherein said second layer (22) has a width in the range from 5 to 200µm.
Claim 7
Dependent Claim 55 words
The waveguide of any of the preceding claims 1 to 6, wherein said third layer (26) is selected from the group consisting of silicon, SiO ₂, Si 1 -x Ge x and Si 1- x - y Ge x C y so long as the material has a different composition than said second layer (22).
Claim 8
Independent Claim 127 words
A method for fabricating an optical waveguide (10) comprising the steps of: selecting a substrate (12), forming a first layer (18) of silicon over said substrate (12), forming a second layer (22) of material, said material selected from the group consisting of Si 1- x Ge x , and Si 1- x - y Ge x C y over said first layer of silicon, forming a third layer (26) of material over said second layer (22) having an index of refraction different from the index of refraction of said second layer (22), and patterning said third layer (26) to form first areas (29) having a first thickness where said waveguide (10) is desired and forming second areas (30) having a second thickness where no waveguide is desired.
Claim 9
Dependent Claim 33 words
The method of claim 8, wherein said step of forming said first layer (18) includes the step of forming an epitaxial layer having a thickness in the range from 10 nm to 5µm..
Claim 10
Dependent Claim 59 words
The method of claim 9, wherein said step of patterning said third layer (26) includes a first thickness in said first areas (29) in the range from 3-5µm and wherein said first areas (29) of said third layer (26) have a width in the range from 5 to 20 µm or in the range from 15 to 200 µm.
Claim 11
Independent Claim 62 words
The method of any of the preceding claims 8 to 10, wherein said step of forming a second layer (22) includes selecting the mole fraction x of germanium in the range from .012 to .018 or in the range from 0.01 to 0.90 and further includes forming said second layer (22) having a width in the range from 5 - 200 µm.
Claim 12
Independent Claim 41 words
The method of any of the preceding claims 8 to 11, wherein said step of selecting said substrate (12) includes a substrate having a fourth layer (14) of SiO₂ and a fifth layer (16) of Si on its upper surface (17).

References Cited (Backward Citations)

US5109464A Cited
US5107538A Cited

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