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EP0548596A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Method and apparatus for cleaning substrate

Assignee: ThyssenKrupp Nucera Japan Ltd
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Filing: 1992-11-30
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Granted: —
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Expires: 2012-11-30
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Abstract

Abstract A method and apparatus for treating substrates, wherein a substrate holder (3) in which the substrates (2) to be treated are put is mounted on a rotary table (5) with a rotary shaft (4) connected thereto in a treating chamber (1), an ozone-containing gas is fed into the treating chamber through an ozone feed nozzle (7) to fill therein with the ozone-containing gas, ultra-pure water is fed onto the substrates through an associated nozzle (9) while they are rotating, thereby treating them with the thin films of ultra-pure water formed on their surfaces, ultra-pure water alone is fed after removal of undesired materials to rinse the substrates, and the substrates are rotated after the interruption of ultra-pure water for spinning off the ultra-pure water and drying, thereby increasing the rate of removal-by-ozone of organic materials, deposits and the like from the substrates, like wafers.

Inventors

  • 👤 Terumi C/O Chlorine Engineers Corp. Ltd Matsuoka

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-08 00:39
CPC Classifications
H; H10; H10P; H10P70/00; H10P70/20; H10P70/10; H10P70/12; H10P70/15; H10P72/00; H10P72/04; H10P72/0402; H10P72/0406; H10P72/0411; H10P72/0414; B; B08; B08B; B08B2203/00; B08B2203/005

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 34 words
A method for treating substrates such as semiconductor wafers, wherein a treating solution is sprayed on undesired materials on the surfaces of the substrates, while the substrates are rotating, in an ozone-containing gas atmosphere.
Claim 2
Dependent Claim 14 words
A method as claimed in Claim 1, wherein the treating solution is ultra-pure water.
Claim 3
Dependent Claim 33 words
A method as claimed in Claim 1 or 2, wherein the ozone-containing gas atmosphere is created by feeding a mixed phase fluid comprising an ozone-containing gas and ultra-pure water as the treating solution.
Claim 4
Independent Claim 83 words
An apparatus for treating substrates such as semiconductor wafers to remove undesired materials therefrom, which includes a closed treating chamber, a substrate holder for holding a plurality of substrates, said substrate holder being mounted on the treating chamber to which a rotary shaft is connected or a rotary table coupled to a rotary shaft, and a nozzle for feeding an ozone-containing gas and a treating solution or a nozzle for feeding a mixed phase fluid comprising an ozone-containing gas and a treating solution.
Claim 5
Dependent Claim 14 words
An apparatus as claimed in Claim 4, wherein the treating solution is ultra-pure water.

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