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EP0530758A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor package for flip-chip mounting process

Assignee: Fujitsu Ltd
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Filing: 1992-09-02
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Granted: —
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Expires: 2012-09-02
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Abstract

Abstract A semiconductor chip for mounting on a package substrate by a flip-chip process. The semiconductor chip comprises a plurality of electrode pads (22) of a first group provided on a major surface (21a) of the semiconductor chip for external electrical connection such that the electrode pads of the first group covers a major surface of the semiconductor chips in rows and columns; and a plurality of electrode pads (23) of a second group each having size substantially larger than the electrode pads of the first group and provided on the major surface of said semiconductor chip in electrical connection with an active part of the semiconductor chip that is used for a burn-in process; wherein each of the electrode pads (22) of the first group is covered by a solder bump (22) that projects from the major surface of said semiconductor chip with a first distance (H); and wherein each of the electrode pads (23) of the second group is formed of a conductor material having a melting point higher than the solder bump and projecting from the major surface of the semiconductor chip with a second distance (h) that is substantially smaller than the first distance. <IMAGE>

Inventors

  • 👤 Thutomu Yoshizaki

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-04 16:46
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/071; H10W72/072; H10W72/07221; H10W72/07227; H10W72/07231; H10W72/07236; H10W72/20; H10W72/251; H10W72/281; H10W72/285; H10W72/851; H10W72/874; H10W72/877; H10W72/90; H10W72/941; H10W72/944; H10W72/9445; H10W90/00; H10W90/701; H10W90/721; H10W90/724

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 248 words
A semiconductor chip for mounting on a package substrate by a flip-chip process, comprising: a plurality of electrode pads (22) of a first group provided on a major surface (21a) of said semiconductor chip (20) for external electrical connection, each of said electrode pads of said first group having a first lateral size and connected electrically to an active part (201a) of said semiconductor chip, said electrode pads of said first group being provided in rows and columns on said major surface of said semiconductor chip; each of said electrode pads of said first group being covered by a solder bump (22) that projects from said major surface of said semiconductor chip with a first distance (H); characterized in that the semiconductor chip further comprises: a plurality of electrode pads (23) of a second group each having a second lateral size substantially larger than said first lateral size and provided on said major surface (21a) of said semiconductor chip in electrical connection with an active part of said semiconductor chip that is used for a burn-in process; each of said electrode pads of said second group being formed of a conductor material having a melting point higher than said solder bump (22) and projecting from said major surface of said semiconductor chip with a second distance (h) that is substantially smaller than said first distance. each of said electrode pads (23) of said second group being connected electrically to a corresponding electrode pad (22) of said first group.
Claim 2
Dependent Claim 37 words
A semiconductor chip as claimed in claim 1 characterized in that said electrode pads (23) of said second group are formed of a conductor material having a melting point exceeding a melting point of said solder bumps.
Claim 3
Dependent Claim 32 words
A semiconductor chip as claimed in claim 1 characterized in that said electrode pads (23) of said second group are formed of a metal selected from a group of Al and Au.
Claim 4
Dependent Claim 70 words
A semiconductor chip as claimed in claim 1 characterized in that said second distance (h) is set with respect to said first distance (H) such that said solder bumps do not contact with each other when the semiconductor chip is mounted on a package substrate (26, 27) by a flip-chip process wherein said major surface of said semiconductor chip is contacted to a major surface (27a) of a package substrate.
Claim 5
Dependent Claim 27 words
A semiconductor chip as claimed in claim 4 characterized in that said second distance (h) is set smaller than said first distance by 91 - 93 µm.
Claim 6
Dependent Claim 28 words
A semiconductor chip as claimed in claim 1 characterized in that said electrode pads of said second group are disposed along a rim of said semiconductor chip (21).

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