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EP0517548A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Chemical vapor deposition method for forming silicon oxide film

Assignee: NEC Corp
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Filing: 1992-06-05
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Granted: —
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Expires: 2012-06-05
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Abstract

Abstract A chemical vapor deposition method for forming a fluorine-containing silicon oxide film comprises introducing a gaseous mixture of alkoxysilane or its polymers as a source gas with fluoroalkoxysilane added thereto into a reaction chamber and performing decomposition of the gaseous mixture to deposit the fluorine-containing silicon oxide film onto a substrate. During the formation of the fluorine-containing silicon oxide film, at least one of compounds containing phosphorus or boron such as organic phosphorus compounds and organic boron compounds may be evaporated and introduced into said gaseous mixture, thereby adding at least one of phosphorus and boron to said fluorine-containing silicon oxide film. The fluorine-containing oxide film may be formed by effecting the decomposition of the gaseous mixture in the presence of ozone gas, or under ultraviolet radiation, or gas plasma.

Inventors

  • 👤 Tetsuya c/o NEC Corporation Homma

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 13:18
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/44; C23C16/455; C23C16/45514; C23C16/22; C23C16/30; C23C16/40; C23C16/401; C23C16/45561; C23C16/45595

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 51 words
A chemical vapor deposition method for forming a fluorine-containing silicon oxide film comprising introducing a gaseous mixture of alkoxysilane or its polymers as a source gas with fluoroalkoxysilane added thereto into a reaction chamber and performing decomposition of the gaseous mixture to deposit the fluorine-containing silicon oxide film onto a substrate.
Claim 2
Dependent Claim 25 words
The method according to claim 1, in which said alkoxysilane is represented by the general chemical formula, Si(OR)₄, where R is an alkyl radical group.
Claim 3
Dependent Claim 13 words
The method according to claim 2, in which said alkoxysilane is tetra-ethyl orthosilicate.
Claim 4
Dependent Claim 29 words
The method according to claim 1, in which said fluoroalkoxysilane is represented by the general chemical formula, Si(OR′) n F 4-n , where R′ is an alkyl radical group.
Claim 5
Dependent Claim 12 words
The method according to claim 4, in which said fluoroalkoxysilane is fluorotriethoxysilane.
Claim 6
Dependent Claim 58 words
The method according to claim 1, in which during the formation of said fluorine-containing silicon oxide film, at least one of compounds containing phosphorus or boron such as organic phosphorus compounds and organic boron compounds is evaporated and introduced into said gaseous mixture, thereby adding at least one of phosphorus and boron to said fluorine-containing silicon oxide film.
Claim 7
Dependent Claim 31 words
The method according to claim 1, in which said at least one of compounds containing phosphorus or boron is selected from the group consisting of trimethoxy phosphate, PO(OCH₃)₃, and trimethoxyboron, B(OCH₃)₃.
Claim 8
Dependent Claim 32 words
The method according to claim 1, in which said decomposition of the gaseous mixture to deposit the fluorine-containing silicon oxide film onto a substrate is performed at a temperature of about 200°C.
Claim 9
Dependent Claim 36 words
The method according to claim 1, in which said fluorine-containing silicon oxide film is formed by effecting said decomposition of the gaseous mixture in the presence of ozone gas, or under ultraviolet radiation, or gas plasma.

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