EP0506426A1
Expired / Lapsed
EP
⏱️ 0.0 years remaining
Integrated circuit metallization with zero contact enclosure requirements and method of making the same
Assignee: STMicroelectronics lnc USA
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Filing: 1992-03-26
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Granted: —
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Expires: 2012-03-26
Abstract
Abstract A method for forming aluminum metallization for contacting a conductive element in an integrated circuit, and an integrated circuit formed according to the same, is disclosed. According to a first disclosed embodiment, a first aluminum alloy layer is formed within the contact, optionally with a barrier layer between it and the underlying electrode. An etch stop layer is formed thereover, of a material which has a low etch rate to an aluminum etchant species. A second, thicker, aluminum alloy layer is formed thereover. The second aluminum layer is etched until the etch stop layer is reached; the mask for defining the metal line may have an edge within the dimensions of the contact opening. After removal of the exposed etch stop layer, a timed etch removes the first aluminum alloy layer, without exposing the bottom of the contact. The metal line may thus be safely formed, without requiring an enclosure around the contact opening. According to an alternate embodiment, conductive or semiconductive sidewall spacers may be formed, upon which the metal etch can stop, leaving a metal line within the contact dimensions. A further alternative embodiment uses a conductive etch stop layer which covers the entire contact, and upon which the metal etch can stop within the contact opening.
Inventors
- 👤 Fusen E. Chen
- 👤 Fu-Tai Liou
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-03 05:03
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/033; H10W20/036; H10W20/034; H10W20/054; H10W20/056; H10W20/063; H10W20/0633; H10W20/40; H10W20/41; H10W20/425; Y; Y10; Y10S; Y10S438/00; Y10S438/97
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
139 words
A method of forming an interconnection in an integrated circuit through a contact opening in an insulating layer to an underlying conductive element, comprising: forming an etch stop layer within the sidewalls of the contact opening; forming a metal layer over said etch stop layer, said metal layer comprising aluminium, in such a manner that a portion of said metal layer is disposed within said contact opening between portions of said etch stop layer within the sidewalls of the contact opening; defining a mask over a portion of said metal layer, said mask layer overlying said contact opening; and etching portions of said metal layer not covered by said mask, with an etchant which removes said metal layer at a significantly greater rate than it removes said etch stop layer, to expose portions of said etch stop layer thereunder.
Claim 2
Dependent Claim
53 words
The method of claim 1, wherein said mask is sized in such a manner that said metal layer, after said etching step, has an edge which is within the dimensions of said contact opening; and wherein the portion of said conductive element within said contact opening is not exposed after said etching step.
Claim 3
Dependent Claim
70 words
The method of claim 1, further comprising: prior to said step of forming said etch stop layer, forming a lower metal layer comprising aluminum; after said step of etching said metal layer, etching exposed portions of said etch stop layer to expose portions of said lower metal layer; and after said step of etching exposed portions of said etch stop layer, etching said exposed portions of said lower metal layer.
Claim 4
Dependent Claim
21 words
The method of claim 3, wherein said step of etching exposed portions of said lower metal layer is a timed etch.
Claim 5
Dependent Claim
50 words
The method of claim 4, wherein said mask is sized in such a manner that said metal layer, after said etching step, has an edge which is within the dimensions of said contact opening; and wherein said exposed portions of said lower metal layer include portions within said contact opening.
Claim 6
Dependent Claim
28 words
The method of claim 3, further comprising: prior to said step of forming said lower metal layer, forming a barrier layer having portions overlying said underlying conductive element.
Claim 7
Dependent Claim
22 words
The method of claim 6, wherein said step of etching exposed portions of said lower metal layer also etches said barrier layer.
Claim 8
Dependent Claim
45 words
The method of claim 3, wherein said step of forming an etch stop layer comprises: depositing said etch stop layer overall; and anisotropically etching said etch stop layer, so that sidewall spacers of said etch stop layer remain on the sides of said contact opening.
Claim 9
Dependent Claim
36 words
The method of claim 1, wherein said step of forming an etch stop layer comprises: forming a layer of a conductive material overall, so that said conductive material is in contact with said underlying conductive element.
Claim 10
Dependent Claim
48 words
The method of claim 1, 8 or 9, wherein said step of forming said metal layer comprises: depositing said metal layer continuously on the integrated circuit during an increase in the temperature of the integrated circuit beginning below 350°C and increasing to a deposition temperature less than 500°C.
Claim 11
Dependent Claim
18 words
The method of claim 9, further comprising: after said etching step, etching exposed portions of said conductive layer.
Claim 12
Dependent Claim
106 words
An integrated circuit, comprising: a conductive element; an insulating layer overlying said conductive element, having a contact opening therethrough to expose a portion of said conductive element; etch stop material disposed within said contact opening, said etch stop material having a substantially lower etch rate to a selected etchant than the etch rate of aluminum to said selected etchant; and a metal layer, comprising aluminum, in electrical contact with said conductive element, disposed within said contact opening, and having an edge within the dimensions of said contact opening in such a manner that a portion of said etch stop material is exposed by said metal layer.
Claim 13
Dependent Claim
47 words
The integrated circuit of claim 12, further comprising: a lower metal layer, comprising aluminum, disposed within said contact opening between said etch stop material therewithin and said conductive element, said lower metal layer also having a portion exposed by said metal layer and said etch stop material.
Claim 14
Dependent Claim
25 words
The integrated circuit of claim 13, further comprising: a barrier layer disposed within said contact opening between said lower metal layer and said conductive element.
Claim 15
Dependent Claim
20 words
The integrated circuit of claim 12, wherein said etch stop material is disposed along the sidewalls of said contact opening.
Claim 16
Dependent Claim
19 words
The integrated circuit of claim 15, wherein said etch stop material further comprises a semiconductor or is electrically conductive.
Claim 17
Dependent Claim
22 words
The integrated circuit of claim 16, wherein said etch stop material is also disposed between said metal layer and said conductive element.
Claim 18
Dependent Claim
18 words
The integrated circuit of claim 17, wherein said etch stop material is in contact with said conductive element.
References Cited (Backward Citations)
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