Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
187 words
A nonvolatile semiconductor device made up of a plurality of semiconductor elements, each of which comprises: a semiconductor substrate (101) of a first conductivity type; a source region (104) and a drain region (102) which are formed in a surface region of the semiconductor substrate (101) and have a second conductivity type; a first gate electrode (108) formed above a channel region (105) between the source and drain regions (104, 102) and kept in an electrically-floating state by a first gate insulation film (107); and a second gate electrode (110) serving as a control gate and formed above the first gate electrode (108), with a second gate insulation film (109) interposed, said source and drain regions (104, 102) being formed under a third insulation film (106) which is thicker than the first gate insulation film (107) and which isolates the channel region (105) of one semiconductor element from that of an adjacent one, and said source and drain regions (104, 102) being located under the third insulation film (106) and separated from each other at a position corresponding to an end portion of the first gate electrode.
Claim 2
Dependent Claim
187 words
A nonvolatile semiconductor device made up of a plurality of semiconductor elements, each of which comprises: a semiconductor substrate (101) of a first conductivity type; a source region (104) and a drain region (102) which are formed in a surface region of the semiconductor substrate (101) and have a second conductivity type; a first gate electrode (108) formed above a channel region (105) between the source and drain regions (104, 102) and kept in an electrically-floating state by a first gate insulation film (107); and a second gate electrode (110) serving as a control gate and formed above the first gate electrode (108), with a second gate insulation film (109) interposed, said source and drain regions (104, 102) being formed under a third insulation film (106) which is thicker than the first gate insulation film (107) and which isolates the channel region (105) of one semiconductor element from that of an adjacent one, and said source and drain regions (104, 102) being located under the third insulation film (106) and separated from each other at a position corresponding to an end portion of the first gate electrode.
Claim 3
Dependent Claim
31 words
A nonvolatile semiconductor device according to claim 1, characterized in that said third insulation film (106) is a field insulation film which is thicker than said first gate insulation film (107).
Claim 4
Dependent Claim
44 words
A nonvolatile semiconductor device according to claim 1, characterized in that said control gate (110) is located above the first gate electrode (108), the third insulation film (106) and the trench (103), with the second insulation film (109) interposed, and electrically connects adjacent elements.
Claim 5
Dependent Claim
45 words
A nonvolatile semiconductor device according to claim 1, characterized in that said source region (104) and said drain region (102) are isolated from each other by a trench (103) which extends from the third insulation film (106) to the interior of the semiconductor substrate (101).
Claim 6
Dependent Claim
30 words
A nonvolatile semiconductor device according to claim 4, characterized in that said third insulation film is a field insulation film which is thicker than said first gate insulation film (107).
Claim 7
Dependent Claim
44 words
A nonvolatile semiconductor device according to claim 4, characterized in that said control gate (110) is located above the first gate electrode (108), the third insulation film (106) and the trench (103), with the second insulation film (109) interposed, and electrically connects adjacent elements.
Claim 8
Dependent Claim
26 words
A nonvolatile semiconductor device according to claim 1, characterized in that said trench (103) is formed by self-aligning end portions of adjacent first gate electrodes (108).
Claim 9
Dependent Claim
21 words
A nonvolatile semiconductor device according to claim 7, characterized in that said third insulation film (106) is a field insulation film.
Claim 10
Dependent Claim
44 words
A nonvolatile semiconductor device according to claim 7, characterized in that said control gate (110) is located above the first gate electrode (108), the third insulation film (106) and the trench (103), with the second insulation film (109) interposed, and electrically connects adjacent elements.
Claim 11
Independent Claim
227 words
A method of manufacturing a nonvolatile semiconductor device, characterized by comprising the steps of: forming embedded layers (100) of a second conductivity type in a semiconductor substrate (101) of a first conductivity type; forming a channel region (105) between the embedded layers (100) by ion implantation, and then forming a first gate insulation film (107) on the channel region (105); forming an insulation film (106) wl:ich is thicker than the first gate insulation film (107) and located on the embedded layer (100); forming a first gate electrode (108) above the channel region (105) such that the first gate electrode (108) is kept in an electrically floating condition by the first gate insulation film (107), said first gate electrode (108) being formed for each element; forming a trench (103) which extends through the insulation film (106) and the embedded layer (100) and reaches the interior of the semiconductor substrate (101), thereby dividing the embedded layer (100) into a source region (104) and a drain region (102); filling the trench (103) with an insulating material (106), thereby insulating and isolating one element from an adjacent one; forming a second insulation film (109) over the resultant semiconductor structure; and forming a second gate electrode (110) on the first gate electrode (108), the insulation film (106), and the trench (103), so as to electrically connect one element to the adjacent one.
Claim 12
Independent Claim
227 words
A method of manufacturing a nonvolatile semiconductor device, characterized by comprising the steps of: forming embedded layers (100) of a second conductivity type in a semiconductor substrate (101) of a first conductivity type; forming a channel region (105) between the embedded layers (100) by ion implantation, and then forming a first gate insulation film (107) on the channel region (105); forming an insulation film (106) wl:ich is thicker than the first gate insulation film (107) and located on the embedded layer (100); forming a first gate electrode (108) above the channel region (105) such that the first gate electrode (108) is kept in an electrically floating condition by the first gate insulation film (107), said first gate electrode (108) being formed for each element; forming a trench (103) which extends through the insulation film (106) and the embedded layer (100) and reaches the interior of the semiconductor substrate (101), thereby dividing the embedded layer (100) into a source region (104) and a drain region (102); filling the trench (103) with an insulating material (106), thereby insulating and isolating one element from an adjacent one; forming a second insulation film (109) over the resultant semiconductor structure; and forming a second gate electrode (110) on the first gate electrode (108), the insulation film (106), and the trench (103), so as to electrically connect one element to the adjacent one.
Claim 13
Dependent Claim
29 words
A method according to claim 10, characterized in that said trench-forming step is carried out by self-aligning end portions of the first gate electrodes (108) of adjacent two elements.
Claim 14
Dependent Claim
27 words
A method according to claim 10, characterized by further comprising the step of forming a BPSG film (112) on the whole surface of the resultant semiconductor structure.