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Nonvolatile semiconductor device and method of manufacturing the same

Assignee: Toshiba Corp
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Filing: 1990-07-25
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Granted: —
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Expires: 2010-07-25
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Abstract

Abstract A source diffusion region (104) and a drain diffusion region (102) are formed under an insulation film (106) which is thicker than a gate insulation film (107) and which isolates the adjacent channel regions (105) from each other. The adjacent source and drain diffusion regions (104, 102) are isolated from each other by a trench (103) which extends from the central portion of the thick insulation film (106) to the interior of a semiconductor substrate (101). The trench (103) is formed in a self-alignment manner with reference to the end portions of the adjacent floating gate electrodes (108), and the depth of this trench (103) is determined so that the adjacent source and drain diffusion regions (104, 102) can be spaced sufficiently apart from each other.

Inventors

  • 👤 Kuniyoshi C/O Intellectual Prop. Div. Yoshikawa

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-05 14:12
CPC Classifications
H; H10; H10B; H10B69/00; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/684; H10D30/685; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; Y; Y10; Y10S; Y10S148/00; Y10S148/05

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 187 words
A nonvolatile semiconductor device made up of a plurality of semiconductor elements, each of which comprises: a semiconductor substrate (101) of a first conductivity type; a source region (104) and a drain region (102) which are formed in a surface region of the semiconductor substrate (101) and have a second conduc­tivity type; a first gate electrode (108) formed above a channel region (105) between the source and drain regions (104, 102) and kept in an electrically-floating state by a first gate insulation film (107); and a sec­ond gate electrode (110) serving as a control gate and formed above the first gate electrode (108), with a sec­ond gate insulation film (109) interposed, said source and drain regions (104, 102) being formed under a third insulation film (106) which is thicker than the first gate insulation film (107) and which isolates the chan­nel region (105) of one semiconductor element from that of an adjacent one, and said source and drain regions (104, 102) being located under the third insulation film (106) and separated from each other at a position corre­sponding to an end portion of the first gate electrode.
Claim 2
Dependent Claim 187 words
A nonvolatile semiconductor device made up of a plurality of semiconductor elements, each of which comprises: a semiconductor substrate (101) of a first conductivity type; a source region (104) and a drain region (102) which are formed in a surface region of the semiconductor substrate (101) and have a second conduc­tivity type; a first gate electrode (108) formed above a channel region (105) between the source and drain regions (104, 102) and kept in an electrically-floating state by a first gate insulation film (107); and a sec­ond gate electrode (110) serving as a control gate and formed above the first gate electrode (108), with a sec­ond gate insulation film (109) interposed, said source and drain regions (104, 102) being formed under a third insulation film (106) which is thicker than the first gate insulation film (107) and which isolates the chan­nel region (105) of one semiconductor element from that of an adjacent one, and said source and drain regions (104, 102) being located under the third insulation film (106) and separated from each other at a position corre­sponding to an end portion of the first gate electrode.
Claim 3
Dependent Claim 31 words
A nonvolatile semiconductor device according to claim 1, characterized in that said third insulation film (106) is a field insulation film which is thicker than said first gate insulation film (107).
Claim 4
Dependent Claim 44 words
A nonvolatile semiconductor device according to claim 1, characterized in that said control gate (110) is located above the first gate electrode (108), the third insulation film (106) and the trench (103), with the second insulation film (109) interposed, and elec­trically connects adjacent elements.
Claim 5
Dependent Claim 45 words
A nonvolatile semiconductor device according to claim 1, characterized in that said source region (104) and said drain region (102) are isolated from each other by a trench (103) which extends from the third insulation film (106) to the interior of the semiconduc­tor substrate (101).
Claim 6
Dependent Claim 30 words
A nonvolatile semiconductor device according to claim 4, characterized in that said third insulation film is a field insulation film which is thicker than said first gate insulation film (107).
Claim 7
Dependent Claim 44 words
A nonvolatile semiconductor device according to claim 4, characterized in that said control gate (110) is located above the first gate electrode (108), the third insulation film (106) and the trench (103), with the second insulation film (109) interposed, and elec­trically connects adjacent elements.
Claim 8
Dependent Claim 26 words
A nonvolatile semiconductor device according to claim 1, characterized in that said trench (103) is formed by self-aligning end portions of adjacent first gate electrodes (108).
Claim 9
Dependent Claim 21 words
A nonvolatile semiconductor device according to claim 7, characterized in that said third insulation film (106) is a field insulation film.
Claim 10
Dependent Claim 44 words
A nonvolatile semiconductor device according to claim 7, characterized in that said control gate (110) is located above the first gate electrode (108), the third insulation film (106) and the trench (103), with the second insulation film (109) interposed, and elec­trically connects adjacent elements.
Claim 11
Independent Claim 227 words
A method of manufacturing a nonvolatile semi­conductor device, characterized by comprising the steps of: forming embedded layers (100) of a second conduc­tivity type in a semiconductor substrate (101) of a first conductivity type; forming a channel region (105) between the embedded layers (100) by ion implantation, and then forming a first gate insulation film (107) on the channel region (105); forming an insulation film (106) wl:ich is thicker than the first gate insulation film (107) and located on the embedded layer (100); forming a first gate electrode (108) above the channel region (105) such that the first gate electrode (108) is kept in an electrically floating condition by the first gate insulation film (107), said first gate electrode (108) being formed for each element; forming a trench (103) which extends through the insulation film (106) and the embedded layer (100) and reaches the interior of the semiconductor substrate (101), thereby dividing the embedded layer (100) into a source region (104) and a drain region (102); filling the trench (103) with an insulating mate­rial (106), thereby insulating and isolating one element from an adjacent one; forming a second insulation film (109) over the resultant semiconductor structure; and forming a second gate electrode (110) on the first gate electrode (108), the insulation film (106), and the trench (103), so as to electrically connect one element to the adjacent one.
Claim 12
Independent Claim 227 words
A method of manufacturing a nonvolatile semi­conductor device, characterized by comprising the steps of: forming embedded layers (100) of a second conduc­tivity type in a semiconductor substrate (101) of a first conductivity type; forming a channel region (105) between the embedded layers (100) by ion implantation, and then forming a first gate insulation film (107) on the channel region (105); forming an insulation film (106) wl:ich is thicker than the first gate insulation film (107) and located on the embedded layer (100); forming a first gate electrode (108) above the channel region (105) such that the first gate electrode (108) is kept in an electrically floating condition by the first gate insulation film (107), said first gate electrode (108) being formed for each element; forming a trench (103) which extends through the insulation film (106) and the embedded layer (100) and reaches the interior of the semiconductor substrate (101), thereby dividing the embedded layer (100) into a source region (104) and a drain region (102); filling the trench (103) with an insulating mate­rial (106), thereby insulating and isolating one element from an adjacent one; forming a second insulation film (109) over the resultant semiconductor structure; and forming a second gate electrode (110) on the first gate electrode (108), the insulation film (106), and the trench (103), so as to electrically connect one element to the adjacent one.
Claim 13
Dependent Claim 29 words
A method according to claim 10, characterized in that said trench-forming step is carried out by self-­aligning end portions of the first gate electrodes (108) of adjacent two elements.
Claim 14
Dependent Claim 27 words
A method according to claim 10, characterized by further comprising the step of forming a BPSG film (112) on the whole surface of the resultant semiconduc­tor structure.

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