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EP0354858A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Large scale integrated EPROM device having a high coupling factor

Assignee: STMicroelectronics SA
•
Filing: 1989-07-31
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Granted: —
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Expires: 2009-07-31
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Abstract

Abstract The present invention relates to an electrically programmable nonvolatile memory, composed of a grid of word lines (LM2) extending along rows, connecting control gates of floating-gate transistors (23), and of bit lines (LB1, LB2) extending along columns, connecting drains of the floating-gate transistors (23). A conductive zone (35), of dimensions greater than those of the floating gate (23) of the transistors along a horizontal plane, is connected to the floating gate (23) of each transistor of the memory, while being situated opposite the corresponding word line (LM2), from which it is separated by an insulating layer (28). <IMAGE>

Inventors

  • 👤 Albert Bergemont

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-06 16:16
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/10; H10B69/00; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/684; H10D30/685; H10D64/00; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D64/511; H10D64/517; H10D64/518; H10D64/519

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

FR2296914A1 Cited
US4258466A Cited
DE3426306A1 Cited
EP0197284A2 Cited

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