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EP0303079A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor element with a Schottky contact stable at a high temperature

Assignee: Siemens AG
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Filing: 1988-07-20
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Granted: —
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Expires: 2008-07-20
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Abstract

Abstract Translated from German Halbleiterbauelement mit hochtemperaturstabilem Schottky-­Kontakt, bestehend aus einer Wolfram-Bor-Legierung hohen Schmelzpunktes, die amorph abgeschieden wird und während des Temperprozesses eine stabile Schottky-Barriere beibe­hält, wobei die physikalischen Eigenschaften des Schottky-Kon­taktes erhalten bleiben und eine besonders hohe Barrierewirkung gegen Materialdiffusion erzielt wird. Semiconductor component with high-temperature stable Schottky contact, consisting of a tungsten-boron alloy with a high melting point, which is deposited amorphously and maintains a stable Schottky barrier during the annealing process, while maintaining the physical properties of the Schottky contact and a particularly high barrier effect against material diffusion is achieved.

Inventors

  • 👤 Josef Dr. Willer

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-05 04:41
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6729; H10D30/6737; H10D30/6738; H10D30/674; H10D30/675; H10D30/80; H10D30/87; H10D64/00; H10D64/60; H10D64/64; H10D62/00; H10D62/80; H10D62/85

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