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EP0256397A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor device having a burried layer

Assignee: Hitachi Ltd
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Filing: 1987-07-31
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Granted: —
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Expires: 2007-07-31
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Abstract

Abstract A semiconductor device has a structure in which two semiconductor substrates (1, 2) are coupled to each other through a semiconductor oxide film (3) and a metal silicide film (9), and a semiconductor element, for example, a bi-polar transistor is formed in the semicon­ductor substrate (2) on the metal silicide film side, whereby a metal silicide layer (9) having a high melting point is provided beneath one region of the bi-polar transistor for example, an n⁺ buried collector layer (5) and in ohmic contact with the n⁺ buried collector layer. An electrical isolation between the adjacent semiconduc­tor elements is made by an insulating layer (12, 18).

Inventors

  • 👤 Hideo Homma
  • 👤 Yutaka Misawa
  • 👤 Naohiro Momma

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-06 13:42
CPC Classifications
H; H10; H10D; H10D10/00; H10D10/40; H10D10/441; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/019; H10W10/061; H10W10/10; H10W10/181; H10W15/00; H10W15/01; H10P90/1914; H10W10/012; H10W10/13

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 59 words
A semiconductor device in which two semiconduc­tor substrates (1, 2) are coupled to each other through a semiconductor oxide film (3) and a metal silicide film (9), a semiconductor element is formed in the semiconduc­tor substrate (2) on the metal silicide film side, and one region (5) of said semiconductor element is connected to said metal silicide film (9).
Claim 2
Dependent Claim 59 words
A semiconductor device in which two semiconduc­tor substrates (1, 2) are coupled to each other through a semiconductor oxide film (3) and a metal silicide film (9), a semiconductor element is formed in the semiconduc­tor substrate (2) on the metal silicide film side, and one region (5) of said semiconductor element is connected to said metal silicide film (9).
Claim 3
Dependent Claim 29 words
A semiconductor device according to claim 1, wherein said semiconductor element is a bi-polar tran­sistor the collector region (5) of which is connected to said metal silicide film (9).
Claim 4
Dependent Claim 32 words
A semiconductor device according to claim 1, wherein a plurality of said semiconductor elements are formed and the adjacent semiconductor elements are isolated from each other by an insulating layer (12, 18).
Claim 5
Dependent Claim 29 words
A semiconductor device according to claim 3, wherein said semiconductor element is a bi-polar tran­sistor the collector region (5) of which is connected to said metal silicide film (9).

References Cited (Backward Citations)

US3614558A Cited
EP0164646A2 Cited

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