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EP0253631B1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor memory device

Assignee: Oki Electric Industry Co Ltd
•
Filing: 1987-07-14
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Granted: 1992-04-22
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Expires: 2007-07-14
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Abstract

No abstract record available.

Inventors

  • 👤 Masayoshi Sasaki

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-09 08:45
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/403; G11C11/404; H; H10; H10B; H10B12/00; H10B12/30

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 349 words
A semiconductor memory device comprising a memory cell, which memory cell comprises: a first MOS transistor (Q1) of a first channel type formed on a semiconductor substrate and having a gate electrode (25) connected to a word line, a drain and a source, the source being connected to a bit line (31); a charge storage electrode (28) connected to the drain of the first transistor a semiconductor layer (29,30,31) formed over the charge storage electrode, being separated from the charge storage electrode by an insulating film; a second MOS transistor (Q2) of a second channel type different from the first channel type, formed in the semiconductor layer and having a source and a drain, the charge storage electrode of the first MOS transistor forming a gate of the second MOS transistor; the drain of the second transistor being connected to a power supply; the source of the second transistor being connected to a bit line, which is either the same as or separate from the first-mentioned bit line; said memory device further comprising means for controlling writting and reading of data in and out of the memory cell; said control means writting daa by controlling the potential on the word line the bit line connected to the first MOS transistor to supply an electric charge corresponding to the data on the bit line connected to the first MOS transistor; said semiconductor memory device being characterized in that said change storage electrode (28) is formed over the gate electrode of the first transistor, being separated from the gate electrode by an insulating film to form a capacitor that a diode (D1) is formed between the source of said first MOS transistor (Q1) and the but line, and that said control means reads data by controlling the potential on the word line to cause conduction or nonconduction of the second MOS transistor depending on the electric charge stored on the charge storage electrode, thereby providing an output on the bit line connected to the second MOS transistor, the output differing depending on the conduction or nonconduction of the second MOS transistor.
Claim 2
Dependent Claim 349 words
A semiconductor memory device comprising a memory cell, which memory cell comprises: a first MOS transistor (Q1) of a first channel type formed on a semiconductor substrate and having a gate electrode (25) connected to a word line, a drain and a source, the source being connected to a bit line (31); a charge storage electrode (28) connected to the drain of the first transistor a semiconductor layer (29,30,31) formed over the charge storage electrode, being separated from the charge storage electrode by an insulating film; a second MOS transistor (Q2) of a second channel type different from the first channel type, formed in the semiconductor layer and having a source and a drain, the charge storage electrode of the first MOS transistor forming a gate of the second MOS transistor; the drain of the second transistor being connected to a power supply; the source of the second transistor being connected to a bit line, which is either the same as or separate from the first-mentioned bit line; said memory device further comprising means for controlling writting and reading of data in and out of the memory cell; said control means writting daa by controlling the potential on the word line the bit line connected to the first MOS transistor to supply an electric charge corresponding to the data on the bit line connected to the first MOS transistor; said semiconductor memory device being characterized in that said change storage electrode (28) is formed over the gate electrode of the first transistor, being separated from the gate electrode by an insulating film to form a capacitor that a diode (D1) is formed between the source of said first MOS transistor (Q1) and the but line, and that said control means reads data by controlling the potential on the word line to cause conduction or nonconduction of the second MOS transistor depending on the electric charge stored on the charge storage electrode, thereby providing an output on the bit line connected to the second MOS transistor, the output differing depending on the conduction or nonconduction of the second MOS transistor.
Claim 3
Dependent Claim 11 words
A device according to claim 1, wherein the semiconductor is silicon.
Claim 4
Dependent Claim 14 words
A device according to claim 2, wherein the semiconductor layer is a polysilicon layer.
Claim 5
Dependent Claim 45 words
A device according to claim 1, wherein the source of the first MOS transistor is connected to the bit line for writing, and the source of the second MOS transistor is connected to a second bit line for reading, separate from the above-mentioned bit line.
Claim 6
Dependent Claim 30 words
A device according to claim 4, wherein a pn junction diode or a Schottky diode is formed between the drain of the first MOS transistor and the charge storage electrode.
Claim 7
Dependent Claim 37 words
A device according to claim 5, wherein the charge storage electrode is of a conductivity type different from the conductivity type of the drain of the first MOS transistor, to form a pn junction diode between them.
Claim 8
Dependent Claim 31 words
A device according to claim 5, wherein the charge storage electrode is of a metal to form a Schottky junction diode between it and the drain of the first MOS transistor.
Claim 9
Independent Claim 188 words
A device according to any one of the preceding claims wherein: said control means applies a first potential to the word line to make conductive the first MOS transistor for writing data, applying a first potential to the source of the first MOS transistor, for writing data "1", and applying a second potential to the source of the first MOS transistor for writing data "0"; said control means applies a second potential to the word line to keep the first transistor nonconductive for maintaining the data stored on the charge storage electrode; and said control means applies a third potential to the word line for reading data, to change the potential on the charge storage electrode to make the second MOS transistor conductive or nonconductive depending on the data stored on the charge storage electrode, thereby transmitting or not transmitting the potential from the power supply to the source of the second MOS transistor and hence to the bit line connected thereto, the transmission and non-transmission of the potential from the power supply providing different potentials on the bit line connected to the source of the second transistor.
Claim 10
Dependent Claim 91 words
A device according to claim 8, wherein the first MOS transistor is an n-channel transistor, and the second MOS transistor is a p-channel transistor, and the third potential as applied to the word line is lower than the second potential as applied to the word line, which in turn is lower than the first potential as applied to the first potential, and the second potential as applied to the source of the first MOS transistor is lower than the first potential as applied to the source of the second MOS transistor.
Claim 11
Dependent Claim 54 words
A device according to claim 8, wherein the source of the first MOS transistor and the source of the second MOS transistor is in contact with each other to form a pn junction diode, and the source of the second transistor is connected to the common bit line used both for writing and reading.
Claim 12
Dependent Claim 69 words
A device according to claim 8, wherein the source of the first MOS transistor and the source of the second MOS transistor is in contact with each other through a metal layer to form a pn Schottky junction diode between the metal layer and the one of the sources, and the source of the second transistor is connected to the common bit line used both for writing and reading.
Claim 13
Dependent Claim 40 words
A device according to claim 8, wherein the channels of the first and the second transistors extend in the direction of the bit lines and the word lines extend in a direction orthogonal to the direction of the bit lines.
Claim 14
Independent Claim 17 words
A device according to any one of the preceding claims comprising a matrix of said memory cells.

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