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EP0237826A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Method of making a self-aligned metallic contact

Assignee: Siemens AG
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Filing: 1987-02-19
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Granted: —
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Expires: 2007-02-19
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Abstract

Abstract Translated from German Verfahren zur selbstjustierten Herstellung eines z.B. als Gatekontakt dienenden Kontaktes (81) mit einer Abmessung von z.B. 0,3 bis 0,1 µm, wobei Fotolithographie mit lediglich Lichtstrahlung durchzuführen ist. Trotz der geringen Abmessung läßt sich hier ein (Gate-)Kontakt mit sehr geringem Zuleitungswiderstand herstellen. Process for the self-adjusted manufacture of e.g. contact (81) serving as gate contact with a dimension of e.g. 0.3 to 0.1 µm, with photolithography using only light radiation. Despite the small dimensions, a (gate) contact can be made with a very low lead resistance.

Inventors

  • 👤 Josef Dr. Willer

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-06 09:10
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/061; H10D30/0612; H10D30/0614; H10D64/00; H10D64/01; H10D64/012; H10D64/0124; H10D64/0125; Y; Y10; Y10S; Y10S148/00; Y10S148/10; Y10S148/139

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