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EP0214705A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor memory with improvend data programming time

Assignee: Toshiba Corp
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Filing: 1981-10-07
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Granted: —
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Expires: 2001-10-07
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Abstract

Abstract A semiconductor memory is disclosed which includes a plurality of memory arrays (31 1 -31 4 ) each having a plurality of memory cells arranged in a matrix form with column lines and row lines and a plurality of bit outputs,decoder means (33 1 -33 4 , 34,-34.) responsive to first address signals (A2-A7) to select corresponding memory cells in said memory arrays, a plurality of data write circuits (36,, 37,-36., 37 4 ) coupled to said memory arrays for writing data into corresponding memory arrays, a write circuit selecting circuit (45) responsive to second address signals (A0,A1) to select one of said write circuits - (36,,37,) to write data into a corresponding memory array (31,) and means responsive to a control signal (MW1,MW2) to modify said second address signal - (A0, A1) so as to cause said write circuit selecting circuit (45) to select simultaneously more than one of said memory arrays (31,-31,) so as to write data applied to the memory immediately into the selected arrays, thus allowing a plurality of memory cells indifferent arrays to be programmed simultaneously.

Inventors

  • 👤 Hiroshi Iwahashi
  • 👤 Masamichi Asano

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 04:42
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G11C16/10; G11C16/12; G11C16/08; G11C16/32; G11C29/00; G11C29/04; G11C29/08; G11C29/12; G11C29/18; G11C29/30; G11C29/34; G11C7/00; G11C7/22; G11C8/00; G11C8/12

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 162 words
A semiconductor memory characterized by: a plurality of memory arrays (31 1 -31 4 ) each having a plurality of memory cells arranged in a matrix form with column lines and row lines and a plurality of bit outputs; decoder means (33,-33., 34,-34.) responsive to first address signals (A2-A7) to select corresponding memory cells in said memory arrays; a plurality of data write circuits (36,37 1 -36 4 ,37 4 ) coupled to said memory arrays for writing data into corresponding memory arrays; a write circuit selecting circuit (45) responsive to second address signals (A0,A1) to select one of said write circuits (36,,37,) to write data into a corresponding memory array (31,); and means responsive to a control signal (MW1,MW2) to modify said second address signals (AO,A1) so as to cause said write circuit selecting circuit (45) to select simultaneously more than one of said memory arrays (31,-31,) so as to write data applied to the memory immediately into the selected arrays.
Claim 2
Dependent Claim 162 words
A semiconductor memory characterized by: a plurality of memory arrays (31 1 -31 4 ) each having a plurality of memory cells arranged in a matrix form with column lines and row lines and a plurality of bit outputs; decoder means (33,-33., 34,-34.) responsive to first address signals (A2-A7) to select corresponding memory cells in said memory arrays; a plurality of data write circuits (36,37 1 -36 4 ,37 4 ) coupled to said memory arrays for writing data into corresponding memory arrays; a write circuit selecting circuit (45) responsive to second address signals (A0,A1) to select one of said write circuits (36,,37,) to write data into a corresponding memory array (31,); and means responsive to a control signal (MW1,MW2) to modify said second address signals (AO,A1) so as to cause said write circuit selecting circuit (45) to select simultaneously more than one of said memory arrays (31,-31,) so as to write data applied to the memory immediately into the selected arrays.
Claim 3
Dependent Claim 40 words
A memory as claimed in claim 1, wherein said decode means comprises column and row decoders (33 1 ,34 1 ;33 2 ,34 2 ;33 3 ,34 3 ;35 4 ,34 4 ) provided for each of said memory arrays.
Claim 4
Dependent Claim 48 words
A memory as claimed in claim 1 or claim 2, wherein the memory is operable in a program test mode in which the control signal modifies the second address signals so as to allow simultaneous application of the same program test data to said more than one array.
Claim 5
Dependent Claim 42 words
A memory as claimed in any one of claims 1 to 3, in which each of said memory cells is a floating gate type MOS transistor having its gate connected to a row line and its drain connected to a column line.

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