Patent EP0166448A2 successfully refreshed from Google Patents.
EP0166448A2
Expired / Lapsed
EP
⏱️ 0.0 years remaining
IC test equipment
Assignee: Advantest Corp
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Filing: 1985-06-27
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Granted: —
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Expires: 2005-06-27
Abstract
Abstract Magazines (12) each loaded, in series, with IC elements to be tested are stacked, and such stacked magazines are arranged in columns. The lowermost magazines of the stacked magazines of the respective columns are simultaneously brought down by a takeout mechanism (55) onto a magazine receiver (61,62), and the magazines on the magazine receiver are simultaneously but intermittently fed by intermittent stepping means (63) in the direction of their arrangement. The outermost one of the magazines on the magazine receiver is loaded at an IC elment receiving position. The IC elements from the magazine are supplied to a testing station, wherein they are tested, and the tested IC elements are sorted in a sorting station according to their test results and respectively then loaded into IC element receiving magazines in an accumulating station. The accumulating station has an IC receiving magazine stocker room in which IC element receiving magazines are stacked, and an empty magazine stocker room in which empty magazines are stacked. The empty magazines are taken out, one by one, by takeout and loading means from the empty magazine stocker room and each empty magazine is loaded at the position of a selected IC receiving magazine from under it pushing it up in the IC element receiving magazine stocker room.
Inventors
- 👤 Hiroshi Sato
- 👤 Yoshihito Kobayashi
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-09 19:38
CPC Classifications
B; B07; B07C; B07C5/00; B07C5/34; B07C5/344; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
188 words
IC test equipment comprising: an IC element loading station for loading IC elements to be tested; a testing station for testing the IC elements supplied from the IC element loading station; a sorting station supplied with the IC elements tested in the testing station, for sorting them according to their test results; and an accumulating station for receiving the IC elements sorted in the sorting station; wherein the IC element loading station comprises: a magazine stocker in which magazines, each loaded with the IC elements inserted thereinto in series, are stacked and arranged in columns at substantially equal intervals; magazine receiving means disposed under the magazine stocker and extending in the direction of arrangement of the stacks of magazines; a takeout mechanism provided in the magazine stocker, for bringing down the lowermost magazine from each stack of magazines onto the magazine receiving means; stepping means whereby the magazines brought down onto the magazine receiving means are simultaneously but intermittently fed in the direction of their arrangement step by step; and carrier means for carrying the outermost one of the thus fed magazines to an IC element supply position.
Claim 2
Dependent Claim
188 words
IC test equipment comprising: an IC element loading station for loading IC elements to be tested; a testing station for testing the IC elements supplied from the IC element loading station; a sorting station supplied with the IC elements tested in the testing station, for sorting them according to their test results; and an accumulating station for receiving the IC elements sorted in the sorting station; wherein the IC element loading station comprises: a magazine stocker in which magazines, each loaded with the IC elements inserted thereinto in series, are stacked and arranged in columns at substantially equal intervals; magazine receiving means disposed under the magazine stocker and extending in the direction of arrangement of the stacks of magazines; a takeout mechanism provided in the magazine stocker, for bringing down the lowermost magazine from each stack of magazines onto the magazine receiving means; stepping means whereby the magazines brought down onto the magazine receiving means are simultaneously but intermittently fed in the direction of their arrangement step by step; and carrier means for carrying the outermost one of the thus fed magazines to an IC element supply position.
Claim 3
Dependent Claim
78 words
IC test equipment according to claim 1 wherein hooks are provided in a manner to be movable back and forth with respect to both ends of the lowermost magazine of each stack, for supporting the stacked magazines, and wherein the takeout mechanism has receiving bars disposed under the stacked magazines and extending in the direction of their arrangement in opposing relation thereto and is capable of simultaneously supporting all the stacked magazines by moving up the receiving bars.
Claim 4
Dependent Claim
30 words
IC test equipment according to claim 1 or 2 wherein the magazine receiving means comprises a pair of support bars spaced apart in the lengthwise direction of the stacked magazines.
Claim 5
Dependent Claim
127 words
IC element test equipment according to claim 3 wherein a pair of carriage bars are disposed between and lower than the pair of support bars and extending in the direction of arrangement of the stacked magazines; the carriage bars each have ridges formed integrally therewith to form teeth along the lengthwise direction of the carriage bars for receiving the magazines each between adjacent ridges; the carriage bars are supported by first drive means in a manner to be movable up and down so that when they are moved up, the ridges are respectively positioned between adjacent magazines held on the support bars; and the first drive means is supported by second drive means in a manner to reciprocate in the direction of arrangement of the stacked magazines.
Claim 6
Dependent Claim
27 words
IC test equipment according to claim 1 or 2 wherein when the magazines are stacked, they are guided and positioned by positioning means in the magazine stocker.
Claim 7
Dependent Claim
66 words
IC test equipment according to claim 5 wherein the positioning means comprises a pair of magazine guide bars provided for each column of stacked magazines so that the magazines are guided, positioned and stacked between each such pair of guide bars, and wherein each pair of guide bars can be moved by adjusting means an equal distance in opposite directions so as to adjust their spacing.
Claim 8
Dependent Claim
30 words
IC element test equipment according to claim 6 wherein the pairs of guide bars are each provided corresponding to one of both end portions of each column of stacked magazines.
Claim 9
Dependent Claim
58 words
IC element test equipment according to claim 7 wherein first ones of the magazine guide bars of the respective pairs at the both end portions of the magazines are respectively secured to first and second moving plates; and the first and second moving plates are opposite each other and guide and position the both ends of the magazines.
Claim 10
Dependent Claim
136 words
IC element test equipment according to claim 8 wherein the second magazine guide bars of the respective pairs are respectively secured to first and second moving members; the first moving plate and the first moving member are respectively in threaded engagement with the one and the other half portion of a first screw extending in the direction of their movement, the one and the other half portion of the first screw being threaded at the same pitch but in opposite directions; and the second moving plate and the second moving member are respectively in threaded engagement with the one and the other half portion of a second screw extending in the direction of their movement, the one and the other half portion of the second screw being threaded at the same pitch but in opposite direction.
Claim 11
Dependent Claim
202 words
IC element test equipment comprising: an IC element loading station for loading IC elements to be tested; a testing station for testing the IC elements supplied from the IC element loading station; a sorting station supplied with the IC elements tested in the testing station, for sorting them according to their test results; and an accumulating station for receiving the IC elements sorted in the sorting station; wherein the accumulating station comprises: an empty magazine stocker room in which stacks of empty magazines can be housed; an IC element receiving magazine stocker room in which stacks of the magazines can be arranged in columns, the lowermost ones of the stacked magazines being each positioned on a passage of supply of the sorted IC elements from the sorting station, for receiving them; a carrying table disposed under the empty magazine stocker room and the IC element receiving magazine stocker room and reciprocating between them; and takeout and loading means mounted on the carrying table, for taking out one of the lowermost empty magazines from the empty magazine stocker room onto the carrying table and loading it on a selected one of the IC element passage in the IC element receiving magazine stocker room.
Claim 12
Dependent Claim
202 words
IC element test equipment comprising: an IC element loading station for loading IC elements to be tested; a testing station for testing the IC elements supplied from the IC element loading station; a sorting station supplied with the IC elements tested in the testing station, for sorting them according to their test results; and an accumulating station for receiving the IC elements sorted in the sorting station; wherein the accumulating station comprises: an empty magazine stocker room in which stacks of empty magazines can be housed; an IC element receiving magazine stocker room in which stacks of the magazines can be arranged in columns, the lowermost ones of the stacked magazines being each positioned on a passage of supply of the sorted IC elements from the sorting station, for receiving them; a carrying table disposed under the empty magazine stocker room and the IC element receiving magazine stocker room and reciprocating between them; and takeout and loading means mounted on the carrying table, for taking out one of the lowermost empty magazines from the empty magazine stocker room onto the carrying table and loading it on a selected one of the IC element passage in the IC element receiving magazine stocker room.
Claim 13
Dependent Claim
41 words
IC element test equipment according to claim 10 wherein the empty magazines stacked in the empty magazine stocker room and IC receiving magazines stacked in the IC receiving magazine stocker room are both arranged side by side in their widthwise direction.
Claim 14
Dependent Claim
132 words
IC element test equipment according to claim 11 wherein hooks are provided in the empty magazine stocker room in a manner to be movable back and forth with respect to both ends of the lowermost one of the stacked magazines, for supporting the lowermost empty magazine and those stacked thereon; the takeout and loading means is a lift which is mounted on the carrying table in a manner to be movable up and down and is capable of holding the stacked magazines by pushing up the lowermost one; the IC element receiving magazine on each IC element passage is supported at both ends by self-locking claws; and when an empty magazine is pushed up from under the IC element receiving magazine, the self-locking claws are turned upward but hold the empty magazine.
Claim 15
Dependent Claim
86 words
IC element test equipment according to claim 12 wherein pushers capable of pushing up the stacked magazines are mounted, as a part of the takeout and loading means, on the carrying table in a manner to be movable up and down, the pushers being deviated from the lift in the direction of movement of the carrying table; and magazines stacked on the IC receiving magazine on the IC element passage in the IC element receiving magazine stocker room are held at both ends by retractable claws.
Claim 16
Dependent Claim
42 words
IC element test equipment according to any one of claims 10, 12 and 13 wherein when the magazines are stacked in the empty magazine stocker room and the IC receiving magazine stocker room,they are guided and positioned by guide and positioning means.
Claim 17
Dependent Claim
62 words
IC element test equipment according to claim 14 wherein the guide and positioning means comprises a pair of magazine guide bars provided for each row of stacked magazines, for guiding therebetween the magazines to be stacked; and the magazine each pair of guide bars can be moved by adjusting means the same distance in opposite directions so as to adjust their spacing.
Claim 18
Dependent Claim
31 words
IC element test equipment according to claim 15 wherein the pair of magazine guide bars are each provided corresponding to one of both end portions of each column of stacked magazines.
Claim 19
Dependent Claim
55 words
IC element test equipment according to claim 16 wherein first ones of the magazine guide bars of the respective pairs at the both end portions are respectively secured to first and second moving plates; and the first and second moving plates are opposite each other and guide and position the both ends of the magazines.
Claim 20
Dependent Claim
136 words
IC element test equipment according to claim 17 wherein the second magazine guide bars of the respective pairs are respectively secured to first and second moving members; the first moving plate and the first moving member are respectively in threaded engagement with the one and the other half portion of a first screw extending in the direction of their movement, the one and the other half portion of the first screw being threaded at the same pitch but in opposite directions; and the second moving plate and the second moving member are respectively in threaded engagement with the one and the other half portion of a second screw extending in the direction of their movement, the one and the other half portion of the second screw being threaded at the same pitch but in opposite directions.
Claim 21
Dependent Claim
30 words
IC element test equipment according to claim 18 wherein the adjusting means is provided in each of the IC element receiving magazine stocker room and the empty magazine stocker room.
Claim 22
Dependent Claim
146 words
IC element test equipment according to comprising: an IC element loading station for loading IC elements to be tested; a testing station for testing the IC elements supplied from the IC element loading station; a sorting station supplied with the IC elements tested in the testing station, for sorting them according to their test results; and an accumulating station for receiving the IC elements sorted in the sorting station; wherein a magazine stocker room is provided in which magazines for receiving the IC elements in series can be stacked, a pair of opposing magazine guide bars are held in the magazine stocker room and the magazines are guided and positioned by the pair of magazine guide bars and stacked therebetween; and wherein the pair of magazine guide bars can be moved by adjusting means an equal distance in opposite directions so as to adjust their spacing.
Claim 23
Dependent Claim
146 words
IC element test equipment according to comprising: an IC element loading station for loading IC elements to be tested; a testing station for testing the IC elements supplied from the IC element loading station; a sorting station supplied with the IC elements tested in the testing station, for sorting them according to their test results; and an accumulating station for receiving the IC elements sorted in the sorting station; wherein a magazine stocker room is provided in which magazines for receiving the IC elements in series can be stacked, a pair of opposing magazine guide bars are held in the magazine stocker room and the magazines are guided and positioned by the pair of magazine guide bars and stacked therebetween; and wherein the pair of magazine guide bars can be moved by adjusting means an equal distance in opposite directions so as to adjust their spacing.
Claim 24
Dependent Claim
27 words
IC element test equipment according to claim 20 wherein two such pairs of magazine guide bars are provided corresponding to both end portions of the stacked magazines.
Claim 25
Dependent Claim
73 words
IC test equipment according to claim 21 wherein first ones of the magazine guide bars of the two pairs are respectively secured to first and second moving plates disposed in opposing relation to each other; the both end portions of the stacked magazines are guided and positioned by the both pairs of magazine guide bars; and both ends of the stacked magazines are guided and positioned by the first and second moving plates.
Claim 26
Dependent Claim
100 words
IC element test equipment according to claim 22 wherein the second magazine guide bars of the two pairs are respectively secured to first and second moving members; the first and second moving plates are respectively in threaded engagement with first half portions of first and second screws extending in the direction of their movement; the first and second moving members are respectively in threaded engagement with the second half portions of the first and second screws; and the first and second half portions of each of the first and second screws are threaded at the same pitch in opposite directions.
Claim 27
Dependent Claim
143 words
IC element test equipment according to claim 23 wherein the stacked magazines can be arranged in rows in the magazine stocker room; the pair of magazine guide bars are provided corresponding to each row of the stacked magazines at their opposite sides; first ones of the magazine guide bars of the respective pairs on one of the opposite sides are secured to the first moving plate in common to them; the second magazine guide bars of the pairs on the same side are secured to the first moving member in common to them; first ones of the magazine guide bars of the respective pairs on the other side are secured to the second moving plate in common to them; and the second magazine guide bars of the pairs on the same side are secured to the second moving member in common to them.
Claim 28
Dependent Claim
41 words
IC element test equipment according to any one of claims 20 to 24 wherein the magazine stocker room is provided in the IC element loading station, magazines in the magazine stocker room being loaded with the IC elements to be tested.
Claim 29
Dependent Claim
45 words
IC element test equipment according to any one of claims 20 to 24 wherein the magazine stocker room is an IC element receiving magazine stocker room and in which IC element receiving magazines for receiving the IC elements supplied from the sorting station are stacked.
Claim 30
Dependent Claim
47 words
IC element test equipment according to claim 26 wherein a part of the magazine stocker section is an empty magazine stocker room in which empty magazines are stacked; and the empty magazines are supplied to the IC element receiving magazine stocker room for receiving the IC elements.
References Cited (Backward Citations)
No citation records indexed.
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