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EP0165085A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Method of manufacturing aluminium contacts through a thick insulating layer in a circuit

Assignee: STMicroelectronics SA
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Filing: 1985-04-09
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Granted: —
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Expires: 2005-04-09
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Abstract

Abstract Translated from French L'invention concerne les circuits intégrés. Pour réaliser des interconnexions en aluminium (14) sans risque de cassure au niveau des ouvertures de contact dans la couche isolante (12) séparant la couche d'interconnexion (14) du substrat (10), on propose de combler d'abord ces ouvertures avec du silicium polycristallin (18) ou un métal à fort pouvoir couvrant, déposé par décomposition chimique en phase vapeur. Après quoi, on dépose l'aluminium (14) par évaporation. The invention relates to integrated circuits. To make aluminum interconnections (14) without risk of breakage at the contact openings in the insulating layer (12) separating the interconnection layer (14) from the substrate (10), it is first proposed to fill these openings with polycrystalline silicon (18) or a metal with high covering power, deposited by chemical decomposition in the vapor phase. After which, the aluminum (14) is deposited by evaporation.

Inventors

  • 👤 Simon Deleonibus
  • 👤 Guy Dubois

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 23:26
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/062; H10W20/40; H10W20/41; H10W20/425

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

EP0068897A2 Cited
EP0070737A2 Cited
US4392298A Cited
EP0119497A1 Cited

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