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EP0147127A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

A composition of matter of use as a resist in lithography

Assignee: International Business Machines Corp
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Filing: 1984-12-11
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Granted: —
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Expires: 2004-12-11
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Abstract

Abstract A composition of matter is obtained by interreacting a quinone diazo compound and an organosilicon compound. Such a composition can be used as a resist in a lithographic process.

Inventors

  • 👤 Edward Darko Babich
  • 👤 Michael Hatzakis
  • 👤 Jurij Rostyslav Paraszcak
  • 👤 Jane Margaret Shaw

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-02 23:04
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/075; G03F7/0757; G03F7/022; G03F7/023; G03F7/0754

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 25 words
A composition of matter formed by the interreaction of a quinone diazo compound, and an organosilicon compound containing groups reactive with the quinone diazo compound.
Claim 2
Dependent Claim 25 words
A composition of matter formed by the interreaction of a quinone diazo compound, and an organosilicon compound containing groups reactive with the quinone diazo compound.
Claim 3
Dependent Claim 18 words
A composition as claimed in claim 1, wherein the diazo compound contains reactive acid or reactive halo groups.
Claim 4
Dependent Claim 23 words
A composition as claimed in claim 1, wherein the diazo compound contains a reactive halogen group, acid group, or a sulfonyl halide group.
Claim 5
Dependent Claim 15 words
A composition as claimed in any preceding claim, wherein the diazo compound is a quinone-(1,2)-diazide.
Claim 6
Dependent Claim 28 words
A composition as claimed in any of claims 1 to 3, wherein the diazo compound is from a benzoquinone diazide or a naphthoquinone diazide, or a mixture thereof.
Claim 7
Dependent Claim 17 words
A composition as claimed in any of claims 1 to 3, wherein the diazo compound is naphthoquinone-l,2-diazide-5-sulfochloride.
Claim 8
Dependent Claim 27 words
A composition as claimed in any preceding claim, wherein the organosilicon compound contains a reactive hydrogen group, or a reactive alkali metal group, or an epoxy group.
Claim 9
Dependent Claim 28 words
A composition as claimed in claim 7, wherein the organosilicon compound contains a reactive hydrogen group in the form of a hydroxy group, amino group, or mercapto group.
Claim 10
Dependent Claim 25 words
A composition as claimed in any of claims 1 to 6, wherein the organosilicon compound is a polysiloxane, siloxane, silazane, silanol, silane, or silyl compound.
Claim 11
Dependent Claim 27 words
A composition as claimed in any preceding claim, wherein the organosilicon compound contains at least 0.01% by weight of a group reactive with said quinone diazo compound.
Claim 12
Dependent Claim 27 words
A composition as claimed in any preceding claim, wherein the organosilicon compound contains up to about 2% by weight of groups reactive with said quinone diazo compound.
Claim 13
Dependent Claim 22 words
A negative resist material comprising a composition as claimed in claim 7, wherein the organosilicon-compound contains an amine functionality or epoxide functionality.
Claim 14
Dependent Claim 21 words
A positive resist material comprising a composition as claimed in claim 7, wherein the organosilicon compound contains hydroxyl or phenolic functionality.
Claim 15
Dependent Claim 17 words
A process for curing a composition as claimed in any preceding claim comprising subjecting it to radiation.
Claim 16
Dependent Claim 19 words
A process as claimed in 14 wherein the radiation has a wavelength of about 200 to about 450 nm.
Claim 17
Dependent Claim 44 words
A lithographic process comprising forming a layer of a composition as claimed in any of claims 1 to 11 on a substrate, exposing the layer to radiation in a desired pattern, and developing the layer, thereby leaving the desired pattern remaining on the substrate.
Claim 18
Dependent Claim 40 words
A process for preparing a composition as claimed in any of claims 1 to 11, comprising reacting a quinone diazo compound and an organosilicon compound containing groups reactive with the quinone diazo compound in the presence of an acid acceptor.
Claim 19
Dependent Claim 23 words
A process as claimed in claim 17, wherein the acid acceptor is an alkali metal carbonate, or pyridine, of a tertiary organic amine.
Claim 20
Dependent Claim 25 words
A process as claimed claim 17 or 18, wherein the reaction is carried out in the temperature range of normal room temperature to about 60°C.
Claim 21
Dependent Claim 24 words
A process as claimed in any of claims 17 to 19, wherein about equal molar amounts of organosilicon to quinone diazo compound are reacted.

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