Patent EP0146524A2 successfully refreshed from Google Patents.
EP0146524A2
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Crystalline silicas
Assignee: Fina Technology Inc
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Filing: 1984-12-19
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Granted: —
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Expires: 2004-12-19
Abstract
Abstract A novel crystalline silica composition having a silica to alumina atomic ratio not lower than 80 and having a certain specific X-ray diffraction pattern after calcination in air for at least 3 hours at a temperature of at least 500°C.
Inventors
- 👤 Raymond M. Cahen
- 👤 Guy L. G. Debras
- 👤 Georges E. M. J. De Clippeleir
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-06 08:15
CPC Classifications
C; C01; C01B; C01B37/00; C01B37/02; B; B01; B01J; B01J29/00; B01J29/03; B01J29/035; B01J29/04; B01J29/06; B01J29/70; C07; C07C; C07C2/00; C07C2/54; C07C2/64; C07C2/66; B01J2229/00; B01J2229/30; B01J2229/36; C07C2529/00; C07C2529/03; C07C2529/035
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
45 words
Crystalline silicas characterized in that they have a silica to alumina atomic ratio of at least 80 and an X-ray diffraction pattern as set forth in Table 1, after calcination in air for at least 3 hours at a temperature of at least about 500°C.
Claim 2
Dependent Claim
45 words
Crystalline silicas characterized in that they have a silica to alumina atomic ratio of at least 80 and an X-ray diffraction pattern as set forth in Table 1, after calcination in air for at least 3 hours at a temperature of at least about 500°C.
Claim 3
Dependent Claim
22 words
Crystalline silicas according to Claim 1 characterized in that they have a silica to alumina atomic ratio of at least about 120.
Claim 4
Dependent Claim
22 words
Crystalline silicas according to Claim 2 characterized in that they have a silica to alumina atomic ratio of at least about 200.
Claim 5
Dependent Claim
26 words
Crystalline silicas according to Claim 1, characterized in that they have an X-ray diffraction pattern presenting a doublet at the interplanar spacing d = 3.65 A.
Claim 6
Dependent Claim
41 words
Crystalline silicas according to Claim 1, characterized in that they have an X-ray diffraction pattern presenting a doublet at the interplanar spacing d = 3.05 to 3.06 Å and a singlet at the interplanar spacing d = 2.98 to 3.00 A.
References Cited (Backward Citations)
No citation records indexed.
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