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EP0143700A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Process for making integrated circuits having connectors comprising tantalum silicides, and integrated circuits made by this process

Assignee: STMicroelectronics SA
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Filing: 1984-11-16
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Granted: —
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Expires: 2004-11-16
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Abstract

Abstract Translated from French L'invention concerne un circuitintégré dontdes régions de silicium monocristallin (source 14, drain 16), ou polycristallin (grille 18), sont recouvertes de siliciure de tantale TaSi 2 (zones 28, 30, 32) tandis que le reste de la tranche est recouvert d'une couche ininterrompue d'oxyde de tantale Ta 2 O 5 , notamment sur les flancs des grilles de silicum polycristallin (zones 36') et sur l'oxyde épais (zone 34'). Une couche d'alliage d'aluminium (40) vient en contact ponctuellement avec le siliciure de tantale. The invention relates to an integrated circuit in which regions of monocrystalline silicon (source 14, drain 16), or polycrystalline (grid 18), are covered with tantalum silicide TaSi 2 (zones 28, 30, 32) while the rest of the wafer is covered with an uninterrupted layer of tantalum oxide Ta 2 O 5 , in particular on the sides of the polycrystalline silicon grids (zones 36 ') and on the thick oxide (zone 34'). A layer of aluminum alloy (40) comes into punctual contact with the tantalum silicide.

Inventors

  • 👤 Annie Baudrant
  • 👤 Michel Marty

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-09 02:47
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6314; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0212; H10D30/0223; H10D30/0227; H10D62/00; H10D62/80; H10D62/83; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0112; H10D64/60; H10D64/62; H10P14/69; H10P14/692; H10P14/6938; H10P14/6939; H10P14/69393; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6921; H10P14/69215; Y; Y10; Y10S; Y10S148/00; Y10S148/019; Y10S148/02; Y10S148/117; Y10S148/147

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