Test input multiplexing circuit

Claim 2

An electrical circuit for multiplexing signals on an input line, comprising: means coupled to the input line for sensing the presence of a preselected signal on the input line; and a buffer coupled to said sensing means, wherein the output from said buffer is a function of the preselected signal.

Claim 3

An electrical circuit for multiplexing at least 2 information signals, comprising: an input line; two complimentary field effect devices having gates coupled to said input line, wherein each of said field effect devices has a threshold voltage less than one-half of an available power supply voltage, and wherein said field effect devices are coupled together in series to create a current path across the power supply only when both of said field effect devices are on; means coupled to said field effect devices for sensing the passage of current through the current path; and a switch coupled to said sensing means, wherein said switch has a first state when said sensing means detects current flow and a second state when no current flow is detected.

Claim 4

An electrical circuit for multiplexing at least 2 information signals, comprising: an input line; two complimentary field effect devices having gates coupled to said input line, wherein each of said field effect devices has a threshold voltage less than one-half of an available power supply voltage, and wherein said field effect devices are coupled together in series to create a current path across the power supply only when both of said field effect devices are on; means coupled to said field effect devices for sensing the passage of current through the current path; and a switch coupled to said sensing means, wherein said switch has a first state when said sensing means detects current flow and a second state when no current flow is detected.

Claim 5

The circuit of Claim 2, wherein said sensing means comprises: a third field effect device coupled to said complimentary field effect devices, wherein current flowing through the path passes through said third field effect device, and wherein a gate input of said third field effect device is coupled to the current path between said complimentary field effect device to turn said third field effect device on when current flows through the current path; and a fourth field effect device having a gate input, a first output coupled to the current path between said complimentary field effect devices, and a second output coupled to said switch, wherein said fourth field effect device is on only when current flows through the current path.

Claim 6

The circuit of Claim 2, further comprising timing logic means coupled to the output of said switch.

Claim 7

The circuit of Claim 4, wherein said timing logic means comprises a flip-flop.

Claim 8

An electrical circuit for detecting test signals on a data line, comprising: complementary transistors having inputs coupled to the data line; means for detecting current flow through both of said complementary transistors; and switch means coupled to said detecting means for generating a test signal when current is flowing through both of said complementary transistors.

Claim 9

An electrical circuit for detecting test signals on a data line, comprising: complementary transistors having inputs coupled to the data line; means for detecting current flow through both of said complementary transistors; and switch means coupled to said detecting means for generating a test signal when current is flowing through both of said complementary transistors.

Claim 10

An electronic system having a test input multiplexed with a data input according to Claim 6, further comprising: at least one active electronic device coupled to the data line, wherein said active electronic device, said complementary transistors, said detecting means and said switch means are all fabricated on a single integrated circuit chip.