EP0133955A1
Expired / Lapsed
EP
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Test structure for identifying semiconductor chips, and process for their identification
Assignee: Siemens AG
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Filing: 1984-07-25
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Granted: —
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Expires: 2004-07-25
Abstract
Abstract Test structure for identifying semiconductor chips (1) in relation to at least two specified characteristics, consisting of at least one contact area pair disposed on the chip surface with the contact areas (2, 3), with a parallel network (4) electrically containing at least two electronic devices (14) connected in parallel, and two conductors (5) which each connect an end of the parallel network (4) to one of the two contact areas (2, 3) and also a process for identifying semiconductor chips using test structures according to the invention. <IMAGE>
Inventors
- 👤 Günter Dipl.-Ing. Schindlbeck
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-10-31 19:37
CPC Classifications
H; H10; H10W; H10W42/00; H10W42/40; B; B07; B07C; B07C5/00; B07C5/34; B07C5/3412; H10W46/00; H10W46/401; H10W46/403; H10W46/601
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References Cited (Backward Citations)
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