Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
190 words
A method of bonding a surface of a semiconductor body (1) to a surface of a thermally and electrically conductive substrate (2), characterised in that the surface of the semiconductive body is coated with a diffusion barrier layer (4) which is itself coated with a layer (3) of gold, wherein the surface of the substrate is coated with a layer (7) of gold, wherein either or both of said layers (3, 7) of gold are coated with a submicron thickness diffusion layer (5) of metal or alloy that will form or is a metal-gold eutectic with a melting point at a temperature sustainable by the semiconductor body, which diffusion layer, in the case of a material that oxidises, is protected from oxidation by a protective gold coating (6), wherein the two coated surfaces are held together while the assembly is heated to a temperature to cause the formation of a continuous molten metal-gold eutectic layer covering the area of the bond which layer diffuses entirely into the gold of said gold layers without penetrating right through these layers, whereby a diffusion assisted metallic bond is formed between the two surfaces.
Claim 2
Independent Claim
190 words
A method of bonding a surface of a semiconductor body (1) to a surface of a thermally and electrically conductive substrate (2), characterised in that the surface of the semiconductive body is coated with a diffusion barrier layer (4) which is itself coated with a layer (3) of gold, wherein the surface of the substrate is coated with a layer (7) of gold, wherein either or both of said layers (3, 7) of gold are coated with a submicron thickness diffusion layer (5) of metal or alloy that will form or is a metal-gold eutectic with a melting point at a temperature sustainable by the semiconductor body, which diffusion layer, in the case of a material that oxidises, is protected from oxidation by a protective gold coating (6), wherein the two coated surfaces are held together while the assembly is heated to a temperature to cause the formation of a continuous molten metal-gold eutectic layer covering the area of the bond which layer diffuses entirely into the gold of said gold layers without penetrating right through these layers, whereby a diffusion assisted metallic bond is formed between the two surfaces.
Claim 3
Dependent Claim
21 words
A method as claimed in claim 1, wherein the diffusion layer is made of tin or includes tin as a constituent.
Claim 4
Dependent Claim
21 words
A method as claimed in claim 1, wherein the diffusion layer is made of germanium or includes germanium as a constituent.
Claim 5
Dependent Claim
19 words
A method as claimed in claim 1, 2 or 3, wherein the diffusion layer is made of elemental metal.
Claim 6
Dependent Claim
18 words
A method as claimed in claim 1, 2, 3 or 4, wherein the semiconductive body is a laser.
Claim 7
Dependent Claim
20 words
A method as claimed in claim 1, 2, 3, 4 or 5, wherein the semiconductive body is made of GaAlAs.
Claim 8
Dependent Claim
23 words
A method as claimed in claim 1, 2, 3, 4 or 5, wherein the semiconductive body is made of (Ga In As P).
Claim 9
Dependent Claim
18 words
A semiconductor body which has been bonded to a substrate by the method claimed in any preceding claim.