EP0113865A1
Expired / Lapsed
EP
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Semiconductor integrated circuit
Assignee: Hitachi Microcomputer System Ltd
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Filing: 1983-12-09
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Granted: —
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Expires: 2003-12-09
Abstract
Abstract A voltage converter is disposed in a semiconductor integrated circuit so as to lower an external supply voltage (V cc ) and to feed the lowered voltage (V L ) to a partial circuit of the integrated circuit. The voltage converter is constructed so as to produce an output voltage (V L ) suited to ordinary operation in the ordinary operation state of the semiconductor integrated circuit and an aging voltage in the aging test of the circuit.
Inventors
- 👤 Ryoichi Hori
- 👤 Kiyoo Itoh
- 👤 Hitoshi Tanaka
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-04 19:38
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/30; H; H10; H10D; H10D99/00; G05; G05F; G05F1/00; G05F1/10; G05F1/46; G05F1/462; G05F1/465; G11; G11C; G11C5/00; G11C5/14; G11C5/145; G11C5/147; H10D89/00; H10D89/211; H10D89/213
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
102 words
A semiconductor integrated circuit having means to lower an external supply voltage (V CC ) within a chip and to feed the lowered voltage (V L ) to at least a part of internal circuitry; characterised in that the feed means comprises means (BL) to produce an output voltage (V L ) whose change versus the external supply (V CC ) voltage is not constant when said external supply voltage (V CC ) is changed from a lower limit value (Vp) thereof in an ordinary operation range of the chip to a value thereof at an aging operation point of said chip.
Claim 2
Dependent Claim
102 words
A semiconductor integrated circuit having means to lower an external supply voltage (V CC ) within a chip and to feed the lowered voltage (V L ) to at least a part of internal circuitry; characterised in that the feed means comprises means (BL) to produce an output voltage (V L ) whose change versus the external supply (V CC ) voltage is not constant when said external supply voltage (V CC ) is changed from a lower limit value (Vp) thereof in an ordinary operation range of the chip to a value thereof at an aging operation point of said chip.
Claim 3
Dependent Claim
40 words
A semiconductor integrated circuit according to claim 1, wherein the change of the output voltage (V L ) of said feed means (BL) is very small when said external supply voltage (V CC ) changes within the ordinary operation range.
Claim 4
Dependent Claim
48 words
A semiconductor integrated circuit according to claim 1, wherein the change of the output voltage (V Z ) of said feed means (BL) follows upthe change of said external supply voltage (V CC ) when said external supply voltage (V CC ) changes within the ordinary operation range.
Claim 5
Dependent Claim
56 words
A semiconductor integrated circuit according to any of claims 1, 2 and 3, wherein said feed means (BL O , BL 1 ... B L k ) changes its output voltage (V L ) so as to reach unequal aging voltages in succession in accordance with the change of said external supply voltage (V CC ).
Claim 6
Dependent Claim
56 words
A semiconductor integrated circuit according to any of claims 1 to 4, wherein said feed means (BL, BL') comprises means to prevent its output voltage (V L ) from exceeding a breakdown voltage of the internal circuit when said output voltage (V L ) of said feed means (BL, BL') has exceeded a predetermined aging voltage.
Claim 7
Dependent Claim
55 words
A semiconductor integrated circuit according to claim 5, wherein said feed means (BL, BL') comprises means to negatively change its output voltage (V L ) in correspondence with a raise of said external supply (V cc ) voltage when said output voltage (V L ) of said feed means has exceeded the predetermined aging voltage.
References Cited (Backward Citations)
EP0063483A2
Cited
EP0068611A1
Cited
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