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EP0100735A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Lift-off process for fabricating self-aligned contacts

Assignee: Fairchild Semiconductor Corp
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Filing: 1983-08-01
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Granted: —
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Expires: 2003-08-01
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Abstract

Abstract A process is provided for fabricating self-aligned contacts to the surface of an integrated circuit. The process includes the steps of depositing a layer of silicon dioxide 12 on the surface of a semiconductor structure 10; depositing a layer of polyimide 15 on the surface of the silicon dioxide 12; defining openings 23 in the polyimide material 15 and the silicon dioxide 12 to thereby expose regions of the semiconductor structure 10; and depositing metal 22 across the underlying surface and in the openings 23. In the preferred embodiment metal 22 is substantially the same thickness as silicon dioxide 12, and polyimide material 15 is masked using sequentially deposited layers of silicon dioxide 18 and photoresist 21.

Inventors

  • 👤 Alvin Milgram

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-03 05:39
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/20; H10P76/202; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/948; Y10S438/951

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 98 words
A lift-off process for fabricating self-aligned regions of first and second material on the surface of a semiconductor structure comprising: depositing a layer of first material on the surface of the semiconductor structure; depositing a layer of organic masking material on the layer of first material; defining openings in the layer of organic masking material to thereby expose regions of the layer of first material; removing the thereby exposed regions of first material to thereby expose regions of the semiconductor . structure; and depositing second material across the surface of the organic masking material and in the openings.
Claim 2
Dependent Claim 98 words
A lift-off process for fabricating self-aligned regions of first and second material on the surface of a semiconductor structure comprising: depositing a layer of first material on the surface of the semiconductor structure; depositing a layer of organic masking material on the layer of first material; defining openings in the layer of organic masking material to thereby expose regions of the layer of first material; removing the thereby exposed regions of first material to thereby expose regions of the semiconductor . structure; and depositing second material across the surface of the organic masking material and in the openings.
Claim 3
Dependent Claim 27 words
. 2. A process as in Claim 1 further comprising the step of removing all of the organic masking material after the step of depositing second material.
Claim 4
Dependent Claim 20 words
A process as in Claim 1 wherein the step of removing comprises isotropically etching the first layer through the openings.
Claim 5
Dependent Claim 14 words
A process as in Claim 1 wherein the organic masking material comprises a polyimide.
Claim 6
Dependent Claim 13 words
A process as in Claim 4 wherein the first material comprises silicon dioxide.
Claim 7
Dependent Claim 14 words
A process as in Claim 5 wherein the second material comprises electrically conductive material.
Claim 8
Dependent Claim 47 words
A process as in Claim 6 wherein the step of defining openings comprises depositing at least one overlying layer of material on the layer of organic masking material, forming openings in the overlying layer, and etching the organic masking material through the openings in the overlying layer.
Claim 9
Dependent Claim 13 words
A process as in Claim 7 wherein the overlying masking material comprises photoresist.
Claim 10
Dependent Claim 20 words
A process as in Claim 8 wherein the overlying masking material comprises a layer of silicon dioxide overlaid by photoresist.
Claim 11
Dependent Claim 12 words
A process as in Claim 9 wherein the semiconductor structure comprises silicon.

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