EP0068456A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Electromagnetic radiation detection system comprising a radiation limiting shield

Assignee: Honeywell Inc

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Filing: 1982-06-25

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Granted: —

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Expires: 2002-06-25

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Abstract

Abstract The present invention relates to a shield for limiting the radiation received by electromagnetic energy radiation detectors (3, 4) to the radiation provided to the detectors by the optics (13) of an electromagnetic energy detection system. The shield comprises a member (1) transparent to a predetermined spectrum of radiation. An opaque thin film (6) is deposited on a surface of the member, the thin film having apertures (8) defined therein, the detectors viewing the optics through the member and the apertures. The thin film shields the detectors from electromagnetic radiation generated outside the field of view of the optics, thereby improving the sensitivity of the detection system. Virtually any desired thickness for the member may be used, thus allowing very close placement of the shield to the detectors and permitting use of very high density arrays.

Inventors

👤 Mark N. Gurnee

Bibliographic Details

Application Number —

Jurisdiction EP

Data Source google_patents

Last Synchronized 2026-10-28 02:18

CPC Classifications

H; H10; H10F; H10F77/00; H10F77/30; H10F77/306; H10F77/331; H10F77/334; H10F39/00; H10F39/10; H10F39/107

Claims Analysis

Total Claims: 8

Claim 1

Independent Claim 70 words

An electromagnetic radiation detection system comprising a shield for limiting the radiation received by an array of detectors to the radiation provided by the optics within the system, characterized in that the shield comprises a first member (1) transparent to a predetermined spectrum of electromagnetic radiation with an opaque thin film (6) deposited on a surface of said member (1) and with apertures (8) defined in said thin film (6).

Claim 2

Dependent Claim 70 words

Claim 3

Dependent Claim 65 words

System according to claim 1, characterized in that said member (1) consists of a semiconductor substrate having first and second opposing surfaces; the detectors (3,4) are located in spaced relatior on the first surface of said substrate with each detector being viewed by the optics (13) through the second surface; and the opaque thin film (6) is deposited on the second surface of the substrate.

Claim 4

Dependent Claim 47 words

System according to claim 2, characterized in that a further semiconductor substrate (16) is mounted to the opaque thin film (6) so that the opaque thin film is sandwiched between both substrates (1,16) with the further substrate (16) being transparent to a predetermined spectrum of electromagnetic radiation.

Claim 5

Dependent Claim 31 words

System according to claim 3, characterized in that the thin film (6) has a thickness in the range of approximately a few tenths of a micron to approximately a few microns.

Claim 6

Dependent Claim 37 words

System according to claim 4, characterized in that the detectors (4) as viewed from the optics (13) have a particular geometrical configuration, and that the apertures (8) as viewed from the optics have a substantially matching configuration.

Claim 7

Dependent Claim 12 words

System according to claim 5, characterized by a reflecting thin film (6).

Claim 8

Dependent Claim 12 words

System according to claim 5, characterized by an absorbing thin film (6).

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