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EP0021858A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Logic invertor circuit comprising semiconductor devices using the current saturation effect

Assignee: Thales SA
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Filing: 1980-01-15
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Granted: —
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Expires: 2000-01-15
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Abstract

Abstract Translated from French L'invention vise à réaliser un circuit logique fonctionnant avec une seule source d'alimentation et utilisant des transistors à effet de champ "normalement bloqués" et des résistances saturables à très faible consommation, les uns et les autres utilisant une structure commune réalisable en circuit intégré avec un bon rendement de fabrication. The invention aims to produce a logic circuit operating with a single power source and using "normally blocked" field effect transistors and saturable resistors with very low consumption, both using a common structure that can be implemented in circuit integrated with good manufacturing yield. La structure selon l'invention est celle d'un transistor à effet de champ "à canal creusé" dans un matériau tel que Ga As présentant le phénomène de la mobilité différentielle négative des porteurs de charge. L'usinage de la tranchée est effectué par érosion ionique. La structure sans grille constitue la résistance saturable. The structure according to the invention is that of a "hollow channel" field effect transistor in a material such as Ga As having the phenomenon of negative differential mobility of charge carriers. The machining of the trench is carried out by ion erosion. The structure without grid constitutes the saturable resistance. ' Application à la constitution de circuits logiques intégrés de grande rapidité, bonne compatibilité et faible consommation. 'Application to the constitution of integrated logic circuits of great speed, good compatibility and low consumption.

Inventors

  • 👤 Ngu Tung Pham
  • 👤 Gérard Nuzillat

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-06 05:56
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/02; H03K19/08; H03K19/094; H03K19/0952; H10; H10N; H10N80/00; H10N89/00

Claims Analysis

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References Cited (Backward Citations)

FR1455145A Cited
US3487338A Cited
FR1560104A Cited
US3805125A Cited

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