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Device for non-contact thickness measurement

Assignee: INTRON LEIPZIG VEB
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Filing: 1960-04-07
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Granted: —
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Expires: 1980-04-07
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Abstract

No abstract record available.

Inventors

  • 👤 Dipl-Phys Alexander Mende
  • 👤 Walter Hennicke

Bibliographic Details

Application Number —
Jurisdiction DE
Data Source google_patents
Last Synchronized 2026-11-05 19:26
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/08; G01B11/10; G01B11/02; G01B11/04; G01D; G01D5/00; G01D5/26; G01D5/32; G01D5/34; G01D5/36

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

DE1056842B Cited

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