Patent CH440760A successfully refreshed from Google Patents.
CH440760A
Expired / Lapsed
CH
⏱️ 0.0 years remaining
Method for material analysis in a secondary electron emission microscope and secondary electron emission microscope for carrying out the method
Assignee: Balzers Patent Beteilig Ag
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Filing: 1965-09-21
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Granted: —
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Expires: 1985-09-21
Abstract
No abstract record available.
Inventors
- 👤 Moellenstedt Gottfried Dr Prof
- 👤 Helmut Dr Seiler
- 👤 Wodsak Wilfried
Bibliographic Details
Application Number
—
Jurisdiction
CH
Data Source
google_patents
Last Synchronized
2026-11-08 15:34
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/252
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
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