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CA584567A
Expired / Lapsed
CA
⏱️ 0.0 years remaining
Method and apparatus for testing electronic circuits and components
Assignee: DAYSTROM
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Filing: —
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Granted: 1959-10-06
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Expires: 1976-10-06
Abstract
No abstract record available.
Inventors
- 👤 C. Langford Robert
- 👤 Frederich W. Sippach, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
CA
Data Source
google_patents
Last Synchronized
2026-10-26 16:05
CPC Classifications
—
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
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