USRE28481E
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor structure with fusible link and method
Assignee: —
•
Filing: 1974-12-09
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Granted: 1975-07-15
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Expires: 1994-12-09
Abstract
Abstract A semiconductor structure with a fusible link having a semiconductor body with semiconductor devices formed in the semiconductor body and a lead structure carried by the body making contact with the devices formed in the body to form an array in which the lead structure includes at least one fusible link which lies in a single plane and which has a relatively precise thickness and length throughout.
Inventors
No inventors recorded.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 21:32
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/493; H10P; H10P95/00
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
225 words
In a method for forming an array in a semiconductor structure, providing a semiconductor body having a planar surface, forming a plurality of semiconductor devices in the semiconductor body having areas extending to said surface, forming a layer of insulating material on said surface, forming a plurality of spaced separate fusible links on planar portions of the layer of insulating material with each of the fusible links having a portion which is relatively precise and uniform in thicness and width throughout its length so that it can be fused with a relatively precise current level flowing through the same, forming additional layer of insulating material over said first named layer of insulating material, said fusible links and said devices, forming contact openings remote from said precise portions and extending through at least said additional layer of insulating material, forming a lead structure on said additional layer of insulating material extending through said contact openings to establish electrical conducting paths between said fusible links and said devices so that said fusible links are in series with said devices, supplying current to said lead structure for selectively blowing certain of said fusible links to provide the desired array, said current being of a level which is insufficient to harm the semiconductor devices connected to the fusing links but being sufficient to cause said fusible links to blow.
Claim 2
Dependent Claim
225 words
In a method for forming an array in a semiconductor structure, providing a semiconductor body having a planar surface, forming a plurality of semiconductor devices in the semiconductor body having areas extending to said surface, forming a layer of insulating material on said surface, forming a plurality of spaced separate fusible links on planar portions of the layer of insulating material with each of the fusible links having a portion which is relatively precise and uniform in thicness and width throughout its length so that it can be fused with a relatively precise current level flowing through the same, forming additional layer of insulating material over said first named layer of insulating material, said fusible links and said devices, forming contact openings remote from said precise portions and extending through at least said additional layer of insulating material, forming a lead structure on said additional layer of insulating material extending through said contact openings to establish electrical conducting paths between said fusible links and said devices so that said fusible links are in series with said devices, supplying current to said lead structure for selectively blowing certain of said fusible links to provide the desired array, said current being of a level which is insufficient to harm the semiconductor devices connected to the fusing links but being sufficient to cause said fusible links to blow.
Claim 3
Dependent Claim
28 words
A method as in claim 1 wherein said fusible links are formed by depositing a metal of the desired thickness onto the first named layer of insulating material.
Claim 4
Dependent Claim
46 words
A method as in claim 1 wherein said fusible links are formed by depositing metal of greater than the desired thickness upon the first named layer of insulating material and then removing a portion of the deposited metal to provide a layer of the desired thickness.
Claim 5
Dependent Claim
31 words
A method as in claim 1 wherein the additional layer of insulating material serves to absorb a substantial portion of the metal particles from the fusible links when they are blown.
Claim 6
Dependent Claim
207 words
In a method for forming an array in a semiconductor structure, providing a semiconductor body having a planar surface, forming a plurality of semiconductor devices in the semiconductor body having areas extending to said surface, forming a layer of insulating material on said surface, forming a plurality of spaced separate fusible links on planar portions of the layer of insulating material with each of the fusible links having a portion which is relatively precise and uniform in thickness and width throughout its length so that it can be fused with a relatively precise current level flowing through the same, forming a lead structure overlying said first named layer of insulating material to establish electrical conducting paths between said fusible links and said devices so that said fusible links are in series with said devices, forming an additional layer of insulating material overlying said first named layer of insulating material and covering at leAst said fusible links, and supplying current to said lead structure through selected fusible links for blowing the selected fusible links to provide the desired array, said current being of a level which is insufficient to harm the semiconductor devices connected to the fusible links but being sufficient to cause said fusible links to blow.
Claim 7
Dependent Claim
207 words
In a method for forming an array in a semiconductor structure, providing a semiconductor body having a planar surface, forming a plurality of semiconductor devices in the semiconductor body having areas extending to said surface, forming a layer of insulating material on said surface, forming a plurality of spaced separate fusible links on planar portions of the layer of insulating material with each of the fusible links having a portion which is relatively precise and uniform in thickness and width throughout its length so that it can be fused with a relatively precise current level flowing through the same, forming a lead structure overlying said first named layer of insulating material to establish electrical conducting paths between said fusible links and said devices so that said fusible links are in series with said devices, forming an additional layer of insulating material overlying said first named layer of insulating material and covering at leAst said fusible links, and supplying current to said lead structure through selected fusible links for blowing the selected fusible links to provide the desired array, said current being of a level which is insufficient to harm the semiconductor devices connected to the fusible links but being sufficient to cause said fusible links to blow.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1978-07-14 | 1979-01-13 | 1979-07-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1982-07-14 | 1983-01-13 | 1983-07-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1986-07-14 | 1987-01-13 | 1987-07-15 | $7700.00 | Window Closed / Lapsed |