Method for operating an x-ray analysis apparatus with two-dimensional array detector and x-ray analysis apparatus for carrying out the method

Claim 3

The method of claim 1 , further comprising repeating, prior to step d), steps (b) and (c) once or several times with varying displacement.

Claim 4

The method of claim 2 , wherein a plurality of data sets are recorded during continuous, periodic displacement and/or rotation of the detector.

Claim 5

The method of claim 1 , wherein less than 10 pixel elements are swept between said first and said second data sets recordings through displacement and/or rotation of the detector.

Claim 6

The method of claim 4 , wherein the detector is displaced between the first and the second recordings of the data sets by exactly 1 pixel element.

Claim 7

The method of claim 4 , wherein the detector is displaced by a fraction of a pixel element or by 1/n of a pixel element between the first and the seconds recordings, wherein n is a positive integer or a positive integer <10.

Claim 8

The method of claim 2 , wherein the detector is displaced in different detector surface directions.

Claim 9

The method of claim 2 , wherein in step d), pixels of edge regions of the overall data set to which the data sets of some individual recordings do not contribute, are weighted corresponding to an inverse of their recording frequency.

Claim 10

The method of claim 1 , wherein each pixel element is individually associated with a sensitivity, a statistical error, and/or an offset for the recorded measured value, which are considered in step (d) in weighting of a respective pixel during superposition of the first and second recorded data sets.

Claim 11

The method of claim 9 , wherein the first and the second recorded data sets are superposed such that an offset is subtracted for each data point to be superposed, a measured value is normalized corresponding to a sensitivity of a respective pixel element and weighted inversely with respect to a magnitude of an associated statistical error, wherein each pixel has an overall weighting of 1 or 100%.

Claim 12

The method of claim 9 , wherein contributions of certain pixel elements are fixedly weighted with zero when the first and second data sets are superposed in step d) or are weighted with zero for faulty pixel elements which are known to be blind, to generate highly fluctuating signals, or to permanently display their saturation values.

Claim 13

The method of claim 11 , wherein trajectories of respective displacements are adjusted to a spatial distribution of faulty pixel elements or are adjusted such that as few data points as possible consist exclusively of superposed signal contributions of faulty pixel elements.

Claim 14

The method of claim 11 , wherein the detector is composed of several sensor chips bordering via blind edge regions, and the blind edge regions are treated as faulty pixel elements.

Claim 15

The method of claim 1 , wherein trajectories of respective displacements are selected such that an overall statistical error of the overall data set is minimized.

Claim 16

An X-ray analysis device with an X-ray radiation source for irradiating an object under investigation with X-ray radiation, a two-dimensional array detector with pixel elements for spatially resolved detection of the X-ray radiation emitted by the object to obtain a data set or a data set which is a digitized diffractogram or a spectrum, the device comprising: means for recording a first data set in a first relative spatial position among the source, the object, and the detector; means for displacing and/or mtating the detector, in a detector surface, relative to the source and the object without changing a relative position between the source and the object; means for recording a second data set in a second relative spatial position among the source, the object, and the detector; and means for superimposing the first and the second data sets to form an overall data set, wherein pixels of the first and the second recorded data sets are combined corresponding to their actual positions relative to the source and the object.

Claim 17

An X-ray analysis device with an X-ray radiation source for irradiating an object under investigation with X-ray radiation, a two-dimensional array detector with pixel elements for spatially resolved detection of the X-ray radiation emitted by the object to obtain a data set or a data set which is a digitized diffractogram or a spectrum, the device comprising: means for recording a first data set in a first relative spatial position among the source, the object, and the detector; means for displacing and/or mtating the detector, in a detector surface, relative to the source and the object without changing a relative position between the source and the object; means for recording a second data set in a second relative spatial position among the source, the object, and the detector; and means for superimposing the first and the second data sets to form an overall data set, wherein pixels of the first and the second recorded data sets are combined corresponding to their actual positions relative to the source and the object.

Claim 18

The X-ray analysis device of claim 15 , further comprising means for repeating varying detector displacement and recording of data sets prior to superposition of all recorded data sets to form the overall data set.

Claim 19

The X-ray analysis device of claim 15 , wherein a piezo drive is provided to displace the detector.

Claim 20

The X-ray analysis device of claim 15 , wherein the array detector, together with a first stage of an evaluation electronics, is movably disposed on a carrier which does not move during measurement, wherein the first stage is electrically connected to a further stage of the evaluation electronics via a flexible connection for transmitting signals.

Claim 21

The X-ray analysis device of claim 18 , wherein the flexible connection comprises a thin sheet or a polyimide sheet, with integrated conductor paths.

Claim 22

The X-ray analysis device of claim 15 wherein a width B of the blind edge regions is an integer multiple of a width b of a pixel element, each pixel element being individually associated with a sensitivity, a statistical error, and/or an offset for the recorded measured value, which are considered in weighting of a respective pixel during superposition of the first and second recorded data sets, wherein contributions of certain pixel elements are fixedly weighted with zero when the first and second data sets are superposed or are weighted with zero for faulty pixel elements which are known to be blind, to generate highly fluctuating signals, or to permanently display their saturation values, said detector being composed of several sensor chips bordering via blind edge regions, the blind edge regions being treated as faulty pixel elements.