US6917027B2
Expired / Lapsed
US
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Method and apparatus for reducing kTC noise in an active pixel sensor (APS) device
Assignee: Aptina Imaging Corp
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Filing: 2002-04-04
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Granted: 2005-07-12
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Expires: 2022-04-04
Abstract
Abstract An image sensing device, such as a CMOS Active Pixel Sensor (APS) device, includes an array of pixels. Each pixel includes a reset transistor connected between a photodetector and a supply voltage. In a readout operation, a signal integrated onto the photodetector is sampled onto a holding capacitor. The photodetector is then reset in a reference reset operation during which the photodetector is clamped to the supply voltage. A reset signal is sampled from the pixel while the photodetector is clamped to the supply voltage. Reset, or kTC, noise in the reset signal may be filtered by a source-follower transistor in the pixel.
Inventors
- 👤 Alexander I. Krymski
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 13:16
CPC Classifications
H; H04; H04N; H04N25/00; H04N25/60; H04N25/65
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
121 words
An apparatus comprising: a sensor including a plurality of pixels arranged in an array, each pixel including: a photodetector; a node, adapted for providing a supply voltage; a reset transistor connected between the photodetector and the supply voltage node; a sampling branch operative to sample a reset signal from the pixel; and a readout controller operative to perform a reference reset operation by asserting a reset signal on a gate of the reset transistor at a voltage greater than a reference voltage, wherein the reference voltage is a minimum voltage which causes the reset transistor to conduct and clamp the pixel to the supply voltage, and to control the sampling branch to sample the reset signal during the reference reset operation.
Claim 2
Independent Claim
121 words
An apparatus comprising: a sensor including a plurality of pixels arranged in an array, each pixel including: a photodetector; a node, adapted for providing a supply voltage; a reset transistor connected between the photodetector and the supply voltage node; a sampling branch operative to sample a reset signal from the pixel; and a readout controller operative to perform a reference reset operation by asserting a reset signal on a gate of the reset transistor at a voltage greater than a reference voltage, wherein the reference voltage is a minimum voltage which causes the reset transistor to conduct and clamp the pixel to the supply voltage, and to control the sampling branch to sample the reset signal during the reference reset operation.
Claim 3
Dependent Claim
25 words
The apparatus of claim 1 , further comprising a source-follower transistor in the pixel operative to filter high frequency kTC noise from the reset signal.
Claim 4
Dependent Claim
16 words
The apparatus of claim 1 , wherein the sensor comprises an Active Pixel Sensor (APS) device.
Claim 5
Dependent Claim
24 words
The apparatus of claim 1 , wherein the sensor comprises a rolling shutter sensor, and wherein the pixel is a three transistor (3T) pixel.
Claim 6
Independent Claim
143 words
An apparatus comprising: a rolling shutter sensor comprising a plurality of three transistor (3T) pixels arranged in an array, each pixel including: a photodetector; a node, adapted for providing a supply voltage; a reset transistor connected between the photodetector and the supply voltage node; a sampling branch operative to sample a reset signal from the pixel; and a readout controller, wherein said readout controller is operative to perform a reference reset operation by asserting a reset signal on a gate of the reset transistor at a voltage greater than a minimum voltage which causes the reset transistor to conduct and clamp the pixel to the supply voltage, to control the sampling branch to sample the reset signal during the reference reset operation, and to decrease the supply voltage by a threshold voltage of the reset transistor while the reset signal is being sampled.
Claim 7
Independent Claim
143 words
An apparatus comprising: a rolling shutter sensor comprising a plurality of three transistor (3T) pixels arranged in an array, each pixel including: a photodetector; a node, adapted for providing a supply voltage; a reset transistor connected between the photodetector and the supply voltage node; a sampling branch operative to sample a reset signal from the pixel; and a readout controller, wherein said readout controller is operative to perform a reference reset operation by asserting a reset signal on a gate of the reset transistor at a voltage greater than a minimum voltage which causes the reset transistor to conduct and clamp the pixel to the supply voltage, to control the sampling branch to sample the reset signal during the reference reset operation, and to decrease the supply voltage by a threshold voltage of the reset transistor while the reset signal is being sampled.
Claim 8
Independent Claim
118 words
An apparatus comprising: a freeze-frame shutter sensor including a plurality of five transistor (5T) pixels arranged in an array, each pixel including: a photodetector; a node, adapted for providing a supply voltage; a reset transistor connected between the photodetector and the supply voltage node; a sampling branch operative to sample a reset signal from the pixel; and a readout controller operative to perform a reference reset operation by asserting a reset signal on a gate of the reset transistor at a voltage greater than a minimum voltage which causes the reset transistor to conduct and clamp the pixel to the supply voltage, and to control the sampling branch to sample the reset signal during the reference reset operation.
Claim 9
Independent Claim
118 words
An apparatus comprising: a freeze-frame shutter sensor including a plurality of five transistor (5T) pixels arranged in an array, each pixel including: a photodetector; a node, adapted for providing a supply voltage; a reset transistor connected between the photodetector and the supply voltage node; a sampling branch operative to sample a reset signal from the pixel; and a readout controller operative to perform a reference reset operation by asserting a reset signal on a gate of the reset transistor at a voltage greater than a minimum voltage which causes the reset transistor to conduct and clamp the pixel to the supply voltage, and to control the sampling branch to sample the reset signal during the reference reset operation.
Claim 10
Independent Claim
75 words
A method comprising: resetting a sensing node in a pixel by asserting a reset signal at a gate of a reset transistor at a level higher than a reference voltage, wherein the reference voltage is a minimum voltage which causes the reset transistor to conduct and clamp the sensing node to a supply voltage; and sampling a reset value while the reset signal is asserted and the sensing node is clamped to the supply voltage.
Claim 11
Independent Claim
75 words
A method comprising: resetting a sensing node in a pixel by asserting a reset signal at a gate of a reset transistor at a level higher than a reference voltage, wherein the reference voltage is a minimum voltage which causes the reset transistor to conduct and clamp the sensing node to a supply voltage; and sampling a reset value while the reset signal is asserted and the sensing node is clamped to the supply voltage.
Claim 12
Dependent Claim
25 words
The method of claim 7 , wherein said resetting the sensing node comprises resetting a photodetector in a rolling shutter Active Pixel Sensor (APS) device.
Claim 13
Dependent Claim
19 words
The method of claim 7 , wherein said sampling comprises sampling the reset value in a double-sampling readout operation.
Claim 14
Dependent Claim
27 words
A method of claim 7 , wherein said sampling is response to a sample signal and said sample signal is asserted before said reset signal is unasserted.
Claim 15
Dependent Claim
18 words
A method of claim 10 , wherein said sample signal is unasserted before said reset signal is unasserted.
Claim 16
Independent Claim
75 words
A method comprising the steps of: resetting a sensing node in a pixel by asserting a reset signal at a gate of a reset transistor at a level higher than a minimum voltage which causes the reset transistor to conduct and clamp the sensing node to a supply voltage; and sampling a reset value while reducing the supply voltage when the reset signal is asserted and the sensing node is clamped to the supply voltage.
Claim 17
Independent Claim
75 words
A method comprising the steps of: resetting a sensing node in a pixel by asserting a reset signal at a gate of a reset transistor at a level higher than a minimum voltage which causes the reset transistor to conduct and clamp the sensing node to a supply voltage; and sampling a reset value while reducing the supply voltage when the reset signal is asserted and the sensing node is clamped to the supply voltage.
Claim 18
Dependent Claim
25 words
The method of claim 12 , wherein said reducing the supply voltage comprises reducing the supply voltage by a threshold voltage of the reset transistor.
Claim 19
Independent Claim
80 words
A method comprising: resetting a sensing node in a pixel by asserting a reset signal at a gate of a reset transistor at a level higher than a minimum voltage which causes the reset transistor to conduct and clamp the sensing node to a supply voltage to reset a photodetector in a freeze-frame shutter Active Pixel Sensor (APS) device; and sampling a reset value while the reset signal is asserted and the sensing node is clamped to the supply voltage.
Claim 20
Independent Claim
80 words
A method comprising: resetting a sensing node in a pixel by asserting a reset signal at a gate of a reset transistor at a level higher than a minimum voltage which causes the reset transistor to conduct and clamp the sensing node to a supply voltage to reset a photodetector in a freeze-frame shutter Active Pixel Sensor (APS) device; and sampling a reset value while the reset signal is asserted and the sensing node is clamped to the supply voltage.
Claim 21
Dependent Claim
17 words
The method of claim 14 , wherein said Active Pixel Sensor (APS) device includes a memory capacitor.
Claim 22
Independent Claim
84 words
A method for reducing kTC noise in a Complemenary Metal Oxide Semiconductor (CMOS) sensor device, the method comprising: asserting a reset signal at a gate of a reset transistor at a voltage greater than a reference voltage, wherein the reference voltage is a minimum voltage which causes the reset transistor to conduct and clamp a pixel to a supply voltage; and reading a reset value for said pixel in the sensor while a sensing node in the pixel is clamped to said supply voltage.
Claim 23
Independent Claim
84 words
A method for reducing kTC noise in a Complemenary Metal Oxide Semiconductor (CMOS) sensor device, the method comprising: asserting a reset signal at a gate of a reset transistor at a voltage greater than a reference voltage, wherein the reference voltage is a minimum voltage which causes the reset transistor to conduct and clamp a pixel to a supply voltage; and reading a reset value for said pixel in the sensor while a sensing node in the pixel is clamped to said supply voltage.
Claim 24
Dependent Claim
14 words
The method of claim 16 , wherein said supply voltage comprises a constant voltage.
Claim 25
Dependent Claim
22 words
The method of claim 16 , further comprising filtering high frequency kTC noise in the reset signal through a low bandwidth filter.
Claim 26
Dependent Claim
23 words
The method of claim 16 , wherein said reducing noise comprises reducing kTC noise in an Active Pixel Sensor (APS) CMOS sensor device.
Claim 27
Dependent Claim
27 words
A method of claim 16 , wherein said reading is response to a sample signal and said sample signal is asserted before said reset signal is unasserted.
Claim 28
Dependent Claim
18 words
A method of claim 20 , wherein said sample signal is unasserted before said reset signal is unasserted.
References Cited (Backward Citations)
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