US6586280B2
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a semiconductor chip array with two-sided cooling
Assignee: Infineon Technologies North America Corp
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Filing: 2001-08-14
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Granted: 2003-07-01
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Expires: 2021-08-14
Abstract
Abstract A method of manufacturing a semiconductor device including a substrate and a die supported thereon. The substrate has at least one electrical connection region on a first portion of a surface of the substrate. The die has a bottom surface portion supported by a second portion of the surface of the substrate. The die also includes a top surface portion comprising a metal layer and a number of semiconductor elements below the metal layer. The top and bottom surface portions of the die are separated by a die body portion which lies above the surface of the substrate. A conforming metal layer extends from at least a portion of the metal layer of the top surface of the die and electrically interfaces with the at least one electrical connection region on the first portion of the surface of the substrate.
Inventors
- 👤 Chuan Cheah
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 14:14
CPC Classifications
H; H10; H10W; H10W90/00; H10W90/701; H10W70/00; H10W70/60; H10W70/611; H10W70/614; H10W70/099; H10W72/00; H10W72/01; H10W72/0198; H10W72/071; H10W72/073; H10W72/075; H10W72/50; H10W72/531; H10W72/536; H10W72/5363; H10W72/541; H10W72/5438; H10W72/551; H10W72/851; H10W72/874; H10W72/884; H10W72/90; H10W72/951; H10W74/00; H10W74/10; H10W74/15; H10W90/721; H10W90/724; H10W90/731; H10W90/734; H10W90/736; H10W90/751; H10W90/756; H10W99/00
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
233 words
A method of manufacturing a semiconductor device comprising at least one die and a substrate, the substrate having at least one electrical connection region on a top surface of the substrate, the at least one die having a bottom surface supported by the top surface of the substrate separate from the at least one electrical connection region, the at least one die further comprising a top surface having a metal layer and a number of semiconductor elements below the metal layer, the method comprising the steps of: a) insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections, b) enveloping the region above the top surface of the substrate to at least encompass the at least one die and the at least one electrical connection region of the substrate, a dam extending higher than the top surface of the at least one die, c) pouring a flowable, curable conductive material into the enveloped region above the top surface of the substrate, the conductive material covering the top surface of the at least one die, and d) curing the flowable conductive material, whereby an electrical connection is made between the at least one electrical connection region on the surface of the substrate and metal layer of the top surface of the at least one die.
Claim 2
Independent Claim
233 words
A method of manufacturing a semiconductor device comprising at least one die and a substrate, the substrate having at least one electrical connection region on a top surface of the substrate, the at least one die having a bottom surface supported by the top surface of the substrate separate from the at least one electrical connection region, the at least one die further comprising a top surface having a metal layer and a number of semiconductor elements below the metal layer, the method comprising the steps of: a) insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections, b) enveloping the region above the top surface of the substrate to at least encompass the at least one die and the at least one electrical connection region of the substrate, a dam extending higher than the top surface of the at least one die, c) pouring a flowable, curable conductive material into the enveloped region above the top surface of the substrate, the conductive material covering the top surface of the at least one die, and d) curing the flowable conductive material, whereby an electrical connection is made between the at least one electrical connection region on the surface of the substrate and metal layer of the top surface of the at least one die.
Claim 3
Dependent Claim
18 words
The method as in claim 1 , wherein the at least one die is an array of die.
Claim 4
Dependent Claim
34 words
The method as in claim 2 , wherein the at least one electrical connection region on the substrate is a series of lands, at least one land adjacent to each die in the array.
Claim 5
Dependent Claim
47 words
The method as in claim 3 , wherein the step of pouring a flowable, curable conductive material into the enveloped region above the top surface of the substrate creates an electrical pathway between the metal layer of the top surface of each die and the adjacent land.
Claim 6
Dependent Claim
56 words
The method as in claim 2 , wherein the step of insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections includes insulating a land, at least one connecting wire and a gate pad for each die.
Claim 7
Dependent Claim
48 words
The method as in claim 1 , wherein the step of insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections includes masking and deposition of an insulating layer.
Claim 8
Dependent Claim
31 words
The method of claim 1 , wherein the step of enveloping the region above the top surface of the substrate includes depositing a material layer on the perimeter of the substrate.
Claim 9
Dependent Claim
30 words
The method of claim 1 , wherein the step of enveloping the region above the top surface of the substrate includes surrounding the perimeter of the substrate with a barrier.
Claim 10
Dependent Claim
53 words
The method of claim 1 , wherein the step of enveloping the region above the top surface of the substrate precedes the step of insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections.
Claim 11
Dependent Claim
53 words
The method of claim 1 , wherein the step of enveloping the region above the top surface of the substrate follows the step of insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections.
Claim 12
Dependent Claim
55 words
The method of claim 1 , wherein the step of enveloping the region above the top surface of the substrate is concurrent with the step of insulating portions that are exposed on and above the top surface of the substrate that are electrically connected to portions of the semiconductor elements other than upper die connections.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2006-06-30 | 2006-12-30 | 2007-07-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2010-06-30 | 2010-12-30 | 2011-07-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2014-06-30 | 2014-12-30 | 2015-07-01 | $7700.00 | Window Closed / Lapsed |