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US6512182B2 Expired / Lapsed US ⏱️ 0.0 years remaining

Wiring circuit board and method for producing same

Assignee: Niterra Co Ltd
•
Filing: 2002-03-04
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Granted: 2003-01-28
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Expires: 2022-03-04
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Abstract

Abstract The invention relates to a wiring circuit board including an electronic device disposed in a hole of the wiring circuit board; a resin filling the hole such that the electronic device is embedded in the resin; a wiring layer formed on the resin; and an interface between the resin and the wiring layer. This interface has a roughness in a range of 2-6 mum in terms of ten-point mean roughness.

Inventors

  • 👤 Hiroki Takeuchi
  • 👤 Toshifumi Kojima
  • 👤 Kazushige Obayashi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 12:26
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/01; H10W74/019; H05; H05K; H05K1/00; H05K1/02; H05K1/0213; H05K1/0216; H05K1/023; H05K1/0231; H05K1/18; H05K1/182; H05K1/185; H10P; H10P72/00; H10P72/70; H10P72/74; H10W70/00; H10W70/60; H10W70/67; H10W70/68; H10W70/685; H05K2201/00; H05K2201/10; H05K2201/10613; H05K2201/10621; H05K2201/10636; H05K3/00; H05K3/46; H05K3/4602; H10W70/62; H10W70/65; H10W70/654; H10W70/655; H10W70/656; H10W72/00; H10W72/90; H10W72/941; H10W72/9415; H10W74/10; H10W74/15; H10W90/00; H10W90/701; H10W90/721; H10W90/724; H10W90/731; H10W90/734; Y; Y02; Y02P; Y02P70/00; Y02P70/50; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T29/49146; Y10T29/49155; Y10T428/00; Y10T428/24; Y10T428/24802; Y10T428/24917; Y10T428/249921; Y10T428/249994; Y10T428/249995; Y10T428/249996

Claims Analysis

Total Claims: 25
Claim 1
Independent Claim 69 words
A wiring circuit board comprising: an electronic device disposed in a hole of said wiring circuit board; a resin filling said hole such that said electronic device is embedded in said resin; and a wiring layer formed on said resin, thereby forming an interface between said resin and said wiring layer, wherein said interface has a roughness in a range of 2-6 μm in terms of ten-point mean roughness.
Claim 2
Dependent Claim 69 words
A wiring circuit board comprising: an electronic device disposed in a hole of said wiring circuit board; a resin filling said hole such that said electronic device is embedded in said resin; and a wiring layer formed on said resin, thereby forming an interface between said resin and said wiring layer, wherein said interface has a roughness in a range of 2-6 μm in terms of ten-point mean roughness.
Claim 3
Dependent Claim 22 words
A wiring circuit board according to claim 1 , wherein said ten-point mean roughness is defined in Japanese Industrial Standard B 0601.
Claim 4
Dependent Claim 61 words
A wiring circuit board according to claim 1 , wherein said ten-point mean roughness is a sum of (1) an average value of absolute values of heights of five highest profile peaks of a sampled portion of said interface and (2) an average value of absolute values of depths of five deepest profile valleys of said sampled portion of said interface.
Claim 5
Dependent Claim 22 words
A wiring circuit board according to claim 1 , wherein said resin comprises 35-65 volume % of at least one inorganic filler.
Claim 6
Dependent Claim 23 words
A wiring circuit board according to claim 4 , wherein said resin comprises 40-60 volume % of said at least one inorganic filler.
Claim 7
Dependent Claim 23 words
A wiring circuit board according to claim 5 , wherein said resin comprises 40-50 volume % of said at least one inorganic filler.
Claim 8
Dependent Claim 27 words
A wiring circuit board according to claim 4 , wherein said filler is selected from the group consisting of crystalline silica, fused silica, alumina, and silicon nitride.
Claim 9
Dependent Claim 27 words
A wiring circuit board according to claim 4 , wherein said filler is made of particles having a particle size distribution in a range of 0.1-50 μm.
Claim 10
Dependent Claim 21 words
A wiring circuit board according to claim 8 , wherein said particle size distribution is in a range of 0.3-30 μm.
Claim 11
Dependent Claim 21 words
A wiring circuit board according to claim 9 , wherein said particle size distribution is in a range of 0.5-20 μm.
Claim 12
Dependent Claim 22 words
A wiring circuit board according to claim 4 , wherein said filler is made of particles that are substantially spherical in shape.
Claim 13
Dependent Claim 26 words
A wiring circuit board according to claim 4 , wherein said filler is treated with a coupling agent to conduct a surface treatment of said filler.
Claim 14
Dependent Claim 68 words
A wiring circuit board according to claim 1 , wherein said resin comprises: a thermosetting resin that is at least one selected from the group consisting of bisphenol epoxy resins, naphthalene-based epoxy resins, and phenol-novolak resins; a curing agent for curing said thermosetting agent, said curing agent containing an acid anhydride as a component of said curing agent; and 35-65 volume % of at least one inorganic filler.
Claim 15
Dependent Claim 20 words
A wiring circuit board according to claim 13 , wherein said thermosetting resin is at least one naphthalene-based epoxy resin.
Claim 16
Dependent Claim 24 words
A wiring circuit board according to claim 13 , wherein said resin further comprises a curing accelerator for accelerating curing of said thermosetting resin.
Claim 17
Dependent Claim 86 words
A wiring circuit board according to claim 1 , further comprising: a core substrate including said hole that passes through said core substrate; and a buildup layer formed on at least one side of said core substrate, said buildup layer being formed of at least one insulating layer and at least one wiring layer that are alternately stacked together, said buildup layer overlapping with said hole in a direction along which said buildup layer is formed on said at least one side of said core substrate.
Claim 18
Dependent Claim 29 words
A wiring circuit board according to claim 1 , wherein said roughness of said interface is in a range of 2.5-5 μm in terms of said ten-point mean roughness..
Claim 19
Independent Claim 138 words
A method for producing a wiring circuit board, said wiring circuit board comprising: an electronic device disposed in a hole of said wiring circuit board; a resin filling said hole such that said electronic device is embedded in said resin; a wiring layer formed on said resin, thereby forming an interface between said resin and said wiring layer, wherein said interface has a roughness in a range of 2-6 μm in terms of ten-point mean roughness, said method comprising the steps of: (a) forming said hole in a core substrate of said wiring circuit board; (b) disposing said electronic device in said hole; (c) filling said hole with a resin, thereby embedding said electronic device in said resin; (d) making a surface of said resin rough; and (e) forming said wiring layer on said surface of said resin.
Claim 20
Independent Claim 138 words
A method for producing a wiring circuit board, said wiring circuit board comprising: an electronic device disposed in a hole of said wiring circuit board; a resin filling said hole such that said electronic device is embedded in said resin; a wiring layer formed on said resin, thereby forming an interface between said resin and said wiring layer, wherein said interface has a roughness in a range of 2-6 μm in terms of ten-point mean roughness, said method comprising the steps of: (a) forming said hole in a core substrate of said wiring circuit board; (b) disposing said electronic device in said hole; (c) filling said hole with a resin, thereby embedding said electronic device in said resin; (d) making a surface of said resin rough; and (e) forming said wiring layer on said surface of said resin.
Claim 21
Dependent Claim 66 words
A method according to claim 18 , wherein said resin comprises: a thermosetting resin that is at least one selected from the group consisting of bisphenol epoxy resins, naphthalene-based epoxy resins, and phenol-novolak resins; a curing agent for curing said thermosetting agent, said curing agent containing an acid anhydride as a component of said curing agent; and 35-65 volume % of at least one inorganic filler.
Claim 22
Dependent Claim 34 words
A method according to claim 19 , further comprising, between the steps (c) and (d), the step of (f) curing said thermosetting resin by heating said core substrate at a temperature of 110-180° C.
Claim 23
Dependent Claim 55 words
A method according to claim 20 , wherein the step (f) is conducted by heating said core substrate at a first temperature that is not lower than 80° C. and is lower than 120° C. and then at a second temperature that is not lower than 120° C. and is not higher than 180° C.
Claim 24
Dependent Claim 31 words
A method according to claim 18 , wherein the step (d) is conducted by treating said surface of said resin with an oxidizing agent such that said interface has said roughness.
Claim 25
Dependent Claim 32 words
A method according to claim 18 , further comprising, between the steps (d) and (e), the step of (g) activating said surface of said resin with a chemical liquid containing palladium chloride.

References Cited (Backward Citations)

US5290197A Cited
JPH0946046A Cited
JPH11126978A Cited
US6204454B1 Cited
JP2000124352A Cited
US6370013B1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2006-01-27 2006-07-29 2007-01-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2010-01-27 2010-07-29 2011-01-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2014-01-27 2014-07-29 2015-01-28 $7700.00 Window Closed / Lapsed

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