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US6349591B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation

Assignee: Université Pierre et Marie Curie
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Filing: 2000-01-13
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Granted: 2002-02-26
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Expires: 2020-01-13
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Abstract

Abstract A device for controlling the interaction of a tip and a sample includes a deformable element carrying the tip and means for positioning the tip with respect to the sample. The device also includes at lest two electrodes for creating an electrical field that exerts a force. The deformable element is preferably elastically deformable and includes advantageously a cantilever. According to a method for controlling the interaction of a tip and a sample, the tip carried by a deformable element is positioned with respect to the sample and the interaction of the tip and the sample is controlled by creating an electric field using a voltage between at least two electrodes. This electrical field exerts a force on the tip. Applications are to atomic force microscopy (AFM) and to nano-indentation measurements.

Inventors

  • 👤 Christian Fretigny
  • 👤 Denis Michel
  • 👤 Benjamin Brocart
  • 👤 Charlotte Basire

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 14:58
CPC Classifications
G; G01; G01N; G01N3/00; G01N3/40; G01N3/42; G01N3/46; B; B82; B82Y; B82Y35/00; G01Q; G01Q60/00; G01Q60/24; G01Q60/36; G01Q60/366; G01N2203/00; G01N2203/02; G01N2203/026; G01N2203/0286; Y; Y10; Y10S; Y10S977/00; Y10S977/84; Y10S977/849; Y10S977/86; Y10S977/863

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 109 words
A control device for controlling interaction of a tip and a sample, comprising: a deformable element carrying a tip, means for positioning the tip with respect to the sample, the device also comprising at least two electrodes, distinct from the tip, that create an electrical field for exerting a force on the tip; wherein the control device is housed in an atomic force microscope; and wherein the device comprises a sample-holder making up a first of the electrodes and a conductive element comprising a rod or a wire, carried by the sample-holder and making up a second of the at least two electrodes, one of said electrodes being earthed.
Claim 2
Dependent Claim 109 words
A control device for controlling interaction of a tip and a sample, comprising: a deformable element carrying a tip, means for positioning the tip with respect to the sample, the device also comprising at least two electrodes, distinct from the tip, that create an electrical field for exerting a force on the tip; wherein the control device is housed in an atomic force microscope; and wherein the device comprises a sample-holder making up a first of the electrodes and a conductive element comprising a rod or a wire, carried by the sample-holder and making up a second of the at least two electrodes, one of said electrodes being earthed.
Claim 3
Dependent Claim 64 words
A control device for controlling interaction of a tip and a sample, comprising: a deformable element carrying a tip, means for positioning the tip with respect to the sample, the device also comprising at least two electrodes, distinct from the tip, that create an electrical field for exerting a force on the tip; and wherein the control device is housed in a local probe.
Claim 4
Dependent Claim 64 words
A control device for controlling interaction of a tip and a sample, comprising: a deformable element carrying a tip, means for positioning the tip with respect to the sample, the device also comprising at least two electrodes, distinct from the tip, that create an electrical field for exerting a force on the tip; and wherein the control device is housed in a local probe.

References Cited (Backward Citations)

US5210425A Cited
US5553487A Cited
US5670712A Cited
US5804708A Cited
US5880360A Cited
US5874668A Cited
US5866807A Cited
US5900728A Cited
US6185991B1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2005-02-25 2005-08-27 2006-02-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2009-02-25 2009-08-27 2010-02-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2013-02-25 2013-08-27 2014-02-26 $7700.00 Window Closed / Lapsed

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