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US6348158B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Plasma processing with energy supplied

Assignee: NEC Corp
•
Filing: 1999-07-22
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Granted: 2002-02-19
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Expires: 2019-07-22
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Abstract

Abstract In a plasma processing method, a plasma is generated using a process gas, and an electron beam is injected into the plasma to control an electron energy distribution in the plasma. Then, a semiconductor substrate is processed using the plasma with controlled electron energy distribution.

Inventors

  • 👤 Seiji Samukawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 20:20
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32321; H01J37/3233; H01J37/32422

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 47 words
A plasma processing method comprising: generating a plasma in response to a high frequency signal using a process gas; injecting an electron beam into said plasma to control an electron energy distribution in said plasma; and processing a substrate using said plasma with controlled electron energy distribution.
Claim 2
Dependent Claim 47 words
A plasma processing method comprising: generating a plasma in response to a high frequency signal using a process gas; injecting an electron beam into said plasma to control an electron energy distribution in said plasma; and processing a substrate using said plasma with controlled electron energy distribution.
Claim 3
Dependent Claim 24 words
A plasma processing method according to claim 1 , wherein said plasma is generated by said high frequency signal of 300 MHz or above.
Claim 4
Dependent Claim 25 words
A plasma processing method according to claim 1 , wherein halogen radicals and halogen ions can be generated from said process gas in said plasma.
Claim 5
Dependent Claim 48 words
A plasma processing method according to claim 3 , wherein said process gas contains at least one gas selected from the group consisting of CF 4 , C 4 F 8 , CHF 3 , C 2 F 6 , Cl 2 , HBr and BCl 3 .
Claim 6
Dependent Claim 37 words
A plasma processing method according to claim 3 , wherein said process gas further contains a gas selected to control and enhance the generation rates and densities of said halogen radicals and halogen ions to be generated.
Claim 7
Dependent Claim 38 words
A plasma processing method according to claim 5 , wherein said process gas further contains at least one gas selected from the group consisting of O 2 , H 2 , N 2 , He, Ar and Xe.
Claim 8
Dependent Claim 24 words
A plasma processing method according to claim 1 , wherein said process gas is a gas, from which radicals as precursor can be generated.
Claim 9
Dependent Claim 44 words
A plasma processing method according to claim 7 , wherein said process gas contains at least one gas selected from the group consisting of CH 4 , C 2 F 4 , SiH 4 , AlCl 3 , TiCl 4 and WF 4 .
Claim 10
Dependent Claim 26 words
A plasma processing method according to claim 1 , wherein said plasma is one of UHF plasma, ECR plasma, induction coupling plasma and helicon wave plasma.
Claim 11
Dependent Claim 31 words
A plasma processing method according to claim 1 , wherein an energy of said electron beam is controlled to enhance the generation rate of a selected active species to be generated.
Claim 12
Dependent Claim 23 words
A plasma processing method according to claim 1 , wherein said electron beam has energy in a range of 1 to 100 eV.
Claim 13
Dependent Claim 19 words
A plasma processing method according to claim 1 , wherein said electron beam is modulated with respect to time.
Claim 14
Dependent Claim 68 words
A plasma processing method according to claim 1 , wherein said electron beam is pulse-modulated, wherein a pulse energy height of the modulated electron beam is controlled to enhance the generation rate of a selected first active species to be generated, and wherein a time period of a pulse is shorter than a lifetime of a second active species, which should exist together with said first active species.
Claim 15
Dependent Claim 154 words
A plasma processing method according to claim 1 , wherein said electron beam includes first and second types of electron beams, wherein said first and second types of electron beams are pulse-modulated, wherein a pulse energy height of the first type of modulated electron beam is controlled to enhance the generation rate of a selected first active species to be generated, and a time period of a pulse is shorter than a lifetime of a second active species, which should exist together with said first active species, and wherein a pulse energy height of the second type of modulated electron beam is controlled to enhance the generation rate of a selected third active species to be generated, and a time period of a pulse is shorter than a lifetime of said second active species and a lifetime of a fourth active species, whereby said first to fourth active species coexist together in said plasma.
Claim 16
Dependent Claim 45 words
A plasma processing method comprising: generating plasma in response to a high frequency signal using a process gas; and injecting an electron beam into said plasma to produce desired active species in said plasma, wherein said desired active species are used for processing a substrate.
Claim 17
Dependent Claim 45 words
A plasma processing method comprising: generating plasma in response to a high frequency signal using a process gas; and injecting an electron beam into said plasma to produce desired active species in said plasma, wherein said desired active species are used for processing a substrate.

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