US6311638B1
Expired / Lapsed
US
⏱️ 0.0 years remaining
Plasma processing method and apparatus
Assignee: Tokyo Electron Ltd
•
Filing: 2000-02-09
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Granted: 2001-11-06
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Expires: 2020-02-09
Abstract
Abstract A plasma processing apparatus has a vacuum vessel, a high-frequency power generator that generates a high-frequency wave, a waveguide for propagating the high-frequency wave generated by the high-frequency power generator into the vacuum vessel to produce a plasma by ionizing a processing gas supplied into the vacuum vessel and to process a semiconductor wafer supported on a support table in the vacuum vessel. A reflection coefficient measuring unit 5 is combined with a waveguide 35 to take data on a ratio Γ0 of advancing wave from the high-frequency power generator 4 and reflected wave from the plasma and phase theta of reflection coefficient. Factors dominating the electron density of the plasma including the output power of the microwave power generator are controlled on the basis of the measured data, whereby the electron density is controlled and stable processing is ensured.
Inventors
- 👤 Nobuo Ishii
- 👤 Yasuyoshi Yasaka
- 👤 Makoto Ando
- 👤 Naohisa Goto
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 08:57
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32192; H01J37/32266; C; C23; C23C; C23C16/00; C23C16/44; C23C16/50; C23C16/511; H01J37/32082; H01J37/32174; H01J37/32917; H01J37/3299
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
146 words
A plasma processing apparatus comprising: a vacuum vessel; a device that supplies a processing gas into the vacuum vessel; a high-frequency power generator that supplies a high-frequency wave into the vacuum vessel to produce a plasma of the processing gas; a measuring unit that measures a state of a reflected high-frequency wave reflected at the plasma, relative to an advancing high-frequency wave traveling from the high-frequency power generator toward the plasma; a control unit that controls a electron density of the plasma in response to the state of the reflected high-frequency wave measured by the measuring unit; and said measuring unit being a device measures a reflection coefficient in absolute value which is a ratio of the absolute value of an amplitude of the reflected high-frequency wave to the absolute value of an amplitude of the advancing high-frequency wave, and a phase of the reflection coefficient.
Claim 2
Dependent Claim
146 words
A plasma processing apparatus comprising: a vacuum vessel; a device that supplies a processing gas into the vacuum vessel; a high-frequency power generator that supplies a high-frequency wave into the vacuum vessel to produce a plasma of the processing gas; a measuring unit that measures a state of a reflected high-frequency wave reflected at the plasma, relative to an advancing high-frequency wave traveling from the high-frequency power generator toward the plasma; a control unit that controls a electron density of the plasma in response to the state of the reflected high-frequency wave measured by the measuring unit; and said measuring unit being a device measures a reflection coefficient in absolute value which is a ratio of the absolute value of an amplitude of the reflected high-frequency wave to the absolute value of an amplitude of the advancing high-frequency wave, and a phase of the reflection coefficient.
Claim 3
Dependent Claim
18 words
The plasma processing apparatus according to claim 1 , wherein: said high-frequency power generator is a microwave generator.
Claim 4
Dependent Claim
36 words
The plasma processing apparatus according to claim 2 , further comprising: a waveguide for conducting a microwave generated by the microwave generator to the vacuum vessel; and a microwave propagating member provided in the vacuum vessel.
Claim 5
Dependent Claim
32 words
The plasma processing apparatus according to claim 2 , wherein: said microwave propagating member is a plane slot antenna, and a shaft extends into the waveguide in coaxial disposition with the waveguide.
Claim 6
Dependent Claim
19 words
The plasma processing apparatus according to claim 1 , wherein: said high-frequency power generator is an RF wave generator.
Claim 7
Dependent Claim
19 words
The plasma processing apparatus according to claim 1 , wherein: said high-frequency power generator is a UHF power generator.
Claim 8
Dependent Claim
32 words
The plasma processing apparatus according to claim 1 , wherein: said control unit for controlling electron density of the plasma includes a device for controlling an output of the high-frequency power generator.
Claim 9
Dependent Claim
32 words
The plasma processing apparatus according to claim 1 , wherein: said control unit for controlling an electron density of the plasma includes a device for adjusting a pressure within said vacuum vessel.
Claim 10
Dependent Claim
33 words
The plasma processing apparatus according to claim 1 , wherein: said control unit for controlling an electron density of the plasma includes a device for adjusting a flow rate of the processing gas.
Claim 11
Dependent Claim
40 words
The plasma processing apparatus according to claim 1 , wherein: said control unit for controlling an electron density of the plasma includes a device for adjusting a high-frequency bias output power impressed to a table for mounting said object thereon.
Claim 12
Dependent Claim
45 words
The plasma processing apparatus according to claim 1 , wherein: said control unit for controlling an electron density of the plasma includes a high-frequency wave propagating member provided in the vacuum vessel; and a mechanism for adjusting a position of the high-frequency wave propagating member.
Claim 13
Dependent Claim
27 words
The plasma processing apparatus according to claim 1 , further comprising: means for storing said reflection coefficient in absolute value and the phase of the reflection coefficient.
Claim 14
Dependent Claim
57 words
The plasma processing apparatus according to claim 1 , further comprising: a device for judging whether there is an abnormality in the plasma processing on the basis of the reflection coefficient in absolute value and the phase of the reflection coefficient; and means for producing an alarm when said judging device judges that there is an abnormality.
Claim 15
Dependent Claim
171 words
A plasma processing apparatus comprising: a vacuum vessel; a waveguide connected to said vacuum vessel; a device that supplies a processing gas into the vacuum vessel; a high-frequency power generator that supplies a high-frequency wave through said waveguide into the vacuum vessel to produce a plasma of the processing gas within said vacuum vessel; a measuring unit provided in said waveguide to measure a state of a reflected high-frequency wave within said waveguide, reflected at the plasma, relative to an advancing high-frequency wave traveling from the high-frequency power generator through said waveguide toward the plasma; a control unit that controls an electron density of the plasma in response to the state of the reflected high-frequency wave measured by the measuring unit; and said measuring unit being a device that measures a reflection coefficient in absolute value which is a ratio of the absolute value of an amplitude of the reflected high-frequency wave to the absolute value of an amplitude of the advancing high-frequency wave, and a phase of the reflection coefficient.
Claim 16
Dependent Claim
171 words
A plasma processing apparatus comprising: a vacuum vessel; a waveguide connected to said vacuum vessel; a device that supplies a processing gas into the vacuum vessel; a high-frequency power generator that supplies a high-frequency wave through said waveguide into the vacuum vessel to produce a plasma of the processing gas within said vacuum vessel; a measuring unit provided in said waveguide to measure a state of a reflected high-frequency wave within said waveguide, reflected at the plasma, relative to an advancing high-frequency wave traveling from the high-frequency power generator through said waveguide toward the plasma; a control unit that controls an electron density of the plasma in response to the state of the reflected high-frequency wave measured by the measuring unit; and said measuring unit being a device that measures a reflection coefficient in absolute value which is a ratio of the absolute value of an amplitude of the reflected high-frequency wave to the absolute value of an amplitude of the advancing high-frequency wave, and a phase of the reflection coefficient.
Claim 17
Dependent Claim
18 words
The plasma processing apparatus according to claim 14 , wherein said high-frequency power generator is a microwave generator.
Claim 18
Dependent Claim
20 words
The plasma processing apparatus according to claim 15 , further comprising a microwave propagating member provided in said vacuum vessel.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2004-11-05 | 2005-05-07 | 2005-11-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2008-11-05 | 2009-05-07 | 2009-11-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2012-11-05 | 2013-05-07 | 2013-11-06 | $7700.00 | Window Closed / Lapsed |