US6066894A
Expired / Lapsed
US
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Semiconductor device and a method of manufacturing the same
Assignee: United Microelectronics Corp
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Filing: 1998-01-30
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Granted: 2000-05-23
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Expires: 2018-01-30
Abstract
Abstract A low-concentration impurity region and a high-concentration impurity region are formed respectively near the lower surface and the upper surface of an undoped polysilicon film by a first and second ion-implanations. A refractory metal film of tungsten or the like is formed on the polysilicon film. The impurities are thermally diffused to form shallow-junctions of source/drain having low-concentration impurities. Lead-out electrodes having a high-impurity concentration can be formed without impeding formation of the source and drain. The refractory metal film is converted into a silicide with the resistance at the interface between the polysilicon film and the silicide kept lowered.
Inventors
- 👤 Wataru Yokozeki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 13:20
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01326; H10D64/20; H10D64/23; H10D64/251; H10D64/258; H10D64/259; H10P; H10P32/00; H10P32/10; H10P32/14; H10P32/1408; H10P32/1414; H10P32/17; H10P32/171; H10W; H10W20/00; H10W20/40
Claims Analysis
Total Claims: 39
Claim 1
Independent Claim
102 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least two impurity concentration inflection points above an interface between said wiring film and said impurity diffusion layer, and the impurity concentration inflection points are present in about a lower 1/3 range of a thickness of said wiring film and about an upper 1/3 range of the thickness of said wiring film.
Claim 2
Dependent Claim
102 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least two impurity concentration inflection points above an interface between said wiring film and said impurity diffusion layer, and the impurity concentration inflection points are present in about a lower 1/3 range of a thickness of said wiring film and about an upper 1/3 range of the thickness of said wiring film.
Claim 3
Dependent Claim
23 words
A device according to claim 1, wherein said at least two impurity concentration inflection points correspond to maximal values of an impurity concentration.
Claim 4
Dependent Claim
53 words
A device according to claim 1, wherein the diffusion profile of the impurities has at least three impurity concentration inflection points, two of the impurity concentration inflection points correspond to maximal values, and one of the impurity concentration inflection points corresponds to a minimal value which is present between the two maximal values.
Claim 5
Dependent Claim
16 words
A device according to claim 1, wherein said wiring film is made of a silicon film.
Claim 6
Dependent Claim
109 words
A semiconductor device comprising: a first conductive film buried in an insulating film in an element formation region demarcated on a semiconductor substrate; a pair of impurity diffusion layers formed in a surface region of said semiconductor substrate on both sides of said first conductive film; and second conductive films separated from each other to be connected respectively to each of said impurity diffusion layers in said semiconductor substrate on both sides of said first conductive film, and containing impurities, wherein a diffusion profile of the impurities in an entire region of said second conductive film in the direction of thickness has at least two impurity concentration inflection points.
Claim 7
Dependent Claim
109 words
A semiconductor device comprising: a first conductive film buried in an insulating film in an element formation region demarcated on a semiconductor substrate; a pair of impurity diffusion layers formed in a surface region of said semiconductor substrate on both sides of said first conductive film; and second conductive films separated from each other to be connected respectively to each of said impurity diffusion layers in said semiconductor substrate on both sides of said first conductive film, and containing impurities, wherein a diffusion profile of the impurities in an entire region of said second conductive film in the direction of thickness has at least two impurity concentration inflection points.
Claim 8
Dependent Claim
24 words
A device according to claim 5, wherein an interface between said second conductive film and said semiconductor substrate is set in a nondamaged state.
Claim 9
Dependent Claim
23 words
A device according to claim 5, wherein said impurity diffusion layer is formed to partially overlap a diffusion layer having a shallow junction.
Claim 10
Dependent Claim
39 words
A device according to claim 5, further comprising an element isolation structure for demarcating said element formation region on said semiconductor substrate, wherein said second conductive film is buried between the adjacent insulating films covering said first conductive films.
Claim 11
Dependent Claim
17 words
A device according to claim 5, wherein said second conductive film is made of a silicon film.
Claim 12
Dependent Claim
25 words
A device according to claim 5, wherein said second conductive film is made of a silicon film and contains impurities at high and low concentrations.
Claim 13
Dependent Claim
25 words
A device according to claim 6, wherein said second conductive film is made of a silicon film and contains impurities at high and low concentrations.
Claim 14
Dependent Claim
89 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least one impurity concentration inflection point above an interface between said wiring film and said impurity diffusion layer, and the impurity concentration inflection point is present in about a lower 1/3 range of a thickness of said wiring film.
Claim 15
Dependent Claim
89 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least one impurity concentration inflection point above an interface between said wiring film and said impurity diffusion layer, and the impurity concentration inflection point is present in about a lower 1/3 range of a thickness of said wiring film.
Claim 16
Dependent Claim
16 words
A device according to claim 12, wherein said wiring film is made of a silicon film.
Claim 17
Dependent Claim
35 words
A device according to claim 12, wherein the diffusion profile of the impurities has another impurity concentration inflection point to be present in about an upper 1/3 range of the thickness of said wiring film.
Claim 18
Dependent Claim
32 words
A device according to claim 14, further comprising a silicide film formed on said wiring film, wherein said another impurity concentration inflection point is formed by doping impurities at a high concentration.
Claim 19
Dependent Claim
57 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, and a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least two impurity concentration inflection points.
Claim 20
Dependent Claim
57 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, and a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least two impurity concentration inflection points.
Claim 21
Dependent Claim
24 words
A device according to claim 16, wherein an interface between said second conductive film and said semiconductor substrate is set in a nondamaged state.
Claim 22
Dependent Claim
16 words
A device according to claim 16, wherein said wiring film is made of a silicon film.
Claim 23
Dependent Claim
24 words
A device according to claim 16, wherein said wiring film is made of a silicon film and contains impurities at high and low concentrations.
Claim 24
Dependent Claim
18 words
A device according to claim 16, wherein the impurity concentration inflection points correspond to impurity concentration peak values.
Claim 25
Dependent Claim
23 words
A device according to claim 16, wherein said at least two impurity concentration inflection points correspond to maximal values of an impurity concentration.
Claim 26
Dependent Claim
21 words
A device according to claim 16, wherein the diffusion profile of the impurities has at least three impurity concentration inflection points.
Claim 27
Dependent Claim
53 words
A device according to claim 16, wherein the diffusion profile of the impurities has at least three impurity concentration inflection points, two of the impurity concentration inflection points correspond to maximal values, and one of the impurity concentration inflection points corresponds to a minimal value which is present between the two maximal values.
Claim 28
Dependent Claim
97 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; a wiring film connected to said impurity diffusion layer; and a silicide film formed on said wiring film, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least one impurity concentration inflection point above an interface between said wiring film and said impurity diffusion layer, and the impurity concentration inflection point is present in about an upper 1/3 range of a thickness of said wiring film.
Claim 29
Dependent Claim
97 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; a wiring film connected to said impurity diffusion layer; and a silicide film formed on said wiring film, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has at least one impurity concentration inflection point above an interface between said wiring film and said impurity diffusion layer, and the impurity concentration inflection point is present in about an upper 1/3 range of a thickness of said wiring film.
Claim 30
Dependent Claim
24 words
A device according to claim 24, wherein said at least one impurity concentration inflection point corresponds to a maximal value of an impurity concentration.
Claim 31
Dependent Claim
16 words
A device according to claim 24, wherein said wiring film is made of a silicon film.
Claim 32
Dependent Claim
83 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has n (n is an integer, n≧2) different impurity concentration inflection points, and the impurity concentration inflection points are present in different ranges each corresponding to about 1/n of a thickness of said wiring film.
Claim 33
Dependent Claim
83 words
A semiconductor device comprising: an impurity diffusion layer formed in a semiconductor substrate; and a wiring film connected to said impurity diffusion layer, wherein said wiring film contains impurities, a diffusion profile of the impurities in an entire region of said wiring film in the direction of thickness has n (n is an integer, n≧2) different impurity concentration inflection points, and the impurity concentration inflection points are present in different ranges each corresponding to about 1/n of a thickness of said wiring film.
Claim 34
Dependent Claim
30 words
A device according to claim 27, wherein the impurity concentration inflection points are formed such that an impurity concentration changes stepwise in a direction of thickness of said wiring film.
Claim 35
Dependent Claim
45 words
A device according to claim 27, wherein the impurity concentration inflection points are formed such that an impurity concentration changes stepwise in a direction of thickness of said wiring film, and the impurity concentration becomes higher in proportion to distance from said impurity diffusion layer.
Claim 36
Dependent Claim
18 words
A device according to claim 27, wherein the impurity concentration inflection points correspond to impurity concentration peak values.
Claim 37
Dependent Claim
22 words
A device according to claim 27, wherein at least two impurity concentration inflection points correspond to maximal values of an impurity concentration.
Claim 38
Dependent Claim
53 words
A device according to claim 27, wherein the diffusion profile of the impurities has at least three impurity concentration inflection points, two of the impurity concentration inflection points correspond to maximal values, and one of the impurity concentration inflection points corresponds to a minimal value which is present between the two maximal values.
Claim 39
Dependent Claim
16 words
A device according to claim 27, wherein said wiring film is made of a silicon film.
References Cited (Backward Citations)
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