Timing generator for semiconductor test system

Claim 2

A timing generator to be used in a semiconductor test system for testing a semiconductor device, comprising: a plurality of timing data generators arranged in a parallel fashion and provided with a first clock signal, each of the timing data generator producing a coarse timing signal and a delay time data based on timing data provided by a test program; multiplexing means provided with a second clock signal having a frequency higher than the first clock signal for receiving the coarse timing signals and delay data in parallel and produces selected one of coarse timing signal and the delay data in series; and a variable delay circuit which receives the coarse timing signal and the delay data from the multiplexing means for providing a delay time defined by the delay data to the coarse timing signal.

Claim 3

A timing generator as defined in claim 1, further comprising a selection signal generator for providing a selection signal to the multiplexing means to control the selection operation thereof.

Claim 4

A timing generator as defined in claim 1, further comprising a pulser for producing a pulse signal having a predetermined pulse width upon receiving the coarse timing signal from the multiplexing means.

Claim 5

A timing generator as defined in claim 1, wherein said multiplexing means is comprised of a first multiplexer for selecting one of the coarse timing signals received from the plurality of timing data generator and a second multiplexer for selecting one of the delay data received from the plurality of timing data generators.

Claim 6

A timing generator as defined in claim 4, further comprising a flip-flop circuit which receives the selected coarse timing signal from the first multiplexer and latches the coarse timing signal in synchronism with the second clock signal.

Claim 7

A timing generator as defined in claim 1, wherein the second clock signal has a frequency higher than the frequency of the first clock signal by the number of times equal to the number of timing data generators provided in the parallel fashion.

Claim 8

A timing generator as defined in claim 1, wherein said variable delay circuit is comprised of: a logic delay circuit for delaying the coarse timing signal by an integer multiple of one cycle length of the second clock signal; and an analog delay circuit connected in series with the logic delay circuit for delaying the coarse timing signal by a time length which is a fraction of one cycle length of the second clock signal based on the delay data received from the multiplexing means.

Claim 9

A timing generator as defined in claim 7, wherein the logic delay circuit is formed with series connected flip-flop circuits and a multiplexer which receives outputs of the flip-flop circuits and selects one of the outputs, and the analog delay circuit is formed with a plurality of CMOS gates series connected with one another.

Claim 10

A timing generator as defined in claim 2, wherein the selection signal generator is a counter which increments upon receiving an output pulse having a specified delay time from the variable delay circuit.

Claim 11

A semiconductor test system for testing a semiconductor device by supplying test signals with predetermined timings to a semiconductor device under test (DUT), comprising: a pattern generator for generating a test pattern signal and timing information of the test pattern signal based on a test program; a set pulse generator for generating a set pulse which defines a rising edge of the test pattern signal to be supplied to the DUT; a reset pulse generator for generating a reset pulse which defines a falling edge of the test pattern signal to be supplied to the DUT; a flip-flop circuit for producing the test pattern signal having the rising edge defined by the set pulse from the set pulse generator and the falling edge defined by the reset pulse from the reset pulse generator; wherein each of the set pulse generator and the reset pulse generator comprising: a plurality of timing data generators arranged in a parallel fashion and provided with a first clock signal, each of the timing data generator producing a coarse timing signal and a delay time data based on the timing information provided by the test program; multiplexing means provided with a second clock signal having a frequency higher than the first clock signal for receiving the coarse timing signals and delay data in parallel and produces selected one of coarse timing signal and the delay data in series; and a variable delay circuit which receives the coarse timing signal and the delay data from the multiplexing means for providing a delay time defined by the delay data to the coarse timing signal.

Claim 12

A semiconductor test system for testing a semiconductor device by supplying test signals with predetermined timings to a semiconductor device under test (DUT), comprising: a pattern generator for generating a test pattern signal and timing information of the test pattern signal based on a test program; a set pulse generator for generating a set pulse which defines a rising edge of the test pattern signal to be supplied to the DUT; a reset pulse generator for generating a reset pulse which defines a falling edge of the test pattern signal to be supplied to the DUT; a flip-flop circuit for producing the test pattern signal having the rising edge defined by the set pulse from the set pulse generator and the falling edge defined by the reset pulse from the reset pulse generator; wherein each of the set pulse generator and the reset pulse generator comprising: a plurality of timing data generators arranged in a parallel fashion and provided with a first clock signal, each of the timing data generator producing a coarse timing signal and a delay time data based on the timing information provided by the test program; multiplexing means provided with a second clock signal having a frequency higher than the first clock signal for receiving the coarse timing signals and delay data in parallel and produces selected one of coarse timing signal and the delay data in series; and a variable delay circuit which receives the coarse timing signal and the delay data from the multiplexing means for providing a delay time defined by the delay data to the coarse timing signal.

Claim 13

A semiconductor test system as defined in claim 10, further comprising a driver for receiving the test pattern signal from the flip-flop circuit and supplying the test pattern signal to the DUT with a predetermined amplitude and waveform.

Claim 14

A semiconductor test system as defined in claim 10, each of the set pulse generator and the reset pulse generator further comprising a selection signal generator for providing a selection signal to the multiplexing means to control the selection operation thereof.

Claim 15

A semiconductor test system as defined in claim 10, wherein said multiplexing means is comprised of a first multiplexer for selecting one of the coarse timing signals received from the plurality of timing data generator and a second multiplexer for selecting one of the delay data received from the plurality of timing data generators.

Claim 16

A semiconductor test system as defined in claim 10, each of the set pulse generator and the resent pulse generator further comprising a flip-flop circuit which receives the selected coarse timing signal from the first multiplexer and latches the coarse timing signal in synchronism with the second clock signal.

Claim 17

A semiconductor test system as defined in claim 10, wherein the second clock signal has a frequency higher than the frequency of the first clock signal by the number of times equal to the number of timing data generators provided in the parallel fashion.

Claim 18

A semiconductor test system as defined in claim 10, wherein said variable delay circuit in each of the set pulse generator and the reset pulse generator is comprised of: a logic delay circuit for delaying the coarse timing signal by an integer multiple of one cycle length of the second clock signal; and an analog delay circuit connected in series with the logic delay circuit for delaying the coarse timing signal by a time length which is a fraction of one cycle length of the second clock signal based on the delay data received from the multiplexing means.

Claim 19

A semiconductor test system as defined in claim 16, wherein the logic delay circuit is formed with series connected flip-flop circuits and a multiplexer which receives outputs of the flip-flop circuits and selects one of the outputs, and the analog delay circuit is formed with a plurality of CMOS gates series connected with one another.

Claim 20

A semiconductor test system as defined in claim 12, wherein the selection signal generator is a counter which increments upon receiving an output pulse having a specified delay time from the variable delay circuit.

Claim 21

A semiconductor test system as defined in claim 10, wherein the pattern generator is formed with a plurality of pattern generator blocks each of which corresponds to the timing data generator in the set pulse generator and the resent pulse generator to provide the timing information thereto.

Claim 22

A semiconductor test system as defined in claim 10, wherein the number of timing data generators arranged in parallel in each of the set pulse generator and the resent pulse generator is four, and the frequency of the second clock signal is four times higher than that of the first clock signal.