Apparatus for rapid phase imaging interferometry and method therefor

Claim 1

An interferometric phase imaging apparatus for optically probing a suitable substantially non-birefringent test medium of optically varying length, comprising: a radiation source providing a source beam along an axis of propagation; a polarizer for plane polarizing said source beam along a single polarizing axis, the electric field of said beam being vectorially composed of a first and a second electric field polar components orthogonal to each other of equal magnitude and both oriented in a plane perpendicular to said axis of propagation, said polarizer thus transforming said source beam into a plane polarized source beam; a first non-polarizing beam splitter, for separating said plane polarized source beam into plane polarized probe and reference beams, with the test medium intersecting said probe beam; a wave plate element intersecting a selected beam among either one of said probe beam and said reference beam, said wave plate element modifying the phase of said selected beam first polar component so as to confer a phase difference of N*π/2 radians between said first and second polar components, where N is any odd signed integer; a second non-polarizing beam splitter, which interferentially combines said probe beam and said reference beam into an output beam having first and second polar components, in which the first polar components of said probe beam and said reference beam interfere with each other, but distinctly of the second polar components of said probe beam and said reference beam, which also interfere with each other; a single polarizing beam splitter accomplishing polarized segregation of said output beam according to both said first and said second polar components so as to obtain a first interferogram comprising the first polar components of said output beam and a second interferogram comprising the second polar components of said output beam; and image recovering means, for recovering the images of said first and second interferograms.

Claim 14

A method for optically probing a suitable substantially non-birefringent test medium of optically varying length and obtaining information about the properties thereof by recovering the images of quadrature and in-phase interferograms with an interferometric phase imaging apparatus comprising a plane polarized radiation source, a first and a second non-polarizing beam splitters, a polarizing beam splitter, a wave plate element and imaging recovering means, said method comprising the steps of: a) providing a polarized source beam with the radiation source along an axis of propagation, whereby the source beam is polarized along a polarizing axis, the electric field of said beam being vectorially composed of a first and a second electric field polar components orthogonal to each other and both oriented in a plane perpendicular to said axis of propagation; b) splitting the beam with the said first beam splitter into plane polarized distinct probe and reference beams; c) intersecting said probe beam with the test medium, and intersecting a selected beam among either one of said probe beam and said reference beam with the wave plate element, whereby the phase speed of the first polar of the selected beam is modified by N*π/2 radians, where N is any signed odd integer, relative to its second polar, by the wave plate element; d) merging, at said second non-polarizing beam splitter, said probe beam and said reference beam into a single output beam so as to produce interference between the first polar components of said probe beam and said reference beam and a distinct interference between the second polars of said probe beam and said reference beam; e) segregating said output beam according to its polarization with the polarizing beam splitter, wherein the first and second polar components of said output beam will be separated so as to allow distinct interferograms to be formed, whereby a quadrature interferogram will be formed from said first polar components and an in-phase interferogram will be formed from said second polar components; and f) recovering the images of the quadrature and in-phase interferograms with the image recovering means.

Claim 15

A method for optically probing a suitable substantially non-birefringent test medium of optically varying length and obtaining information about the properties thereof by recovering the images of quadrature and in-phase interferograms with an interferometric phase imaging apparatus comprising a plane polarized radiation source, a first and a second non-polarizing beam splitters, a polarizing beam splitter, a wave plate element and imaging recovering means, said method comprising the steps of: a) providing a polarized source beam with the radiation source along an axis of propagation, whereby the source beam is polarized along a polarizing axis, the electric field of said beam being vectorially composed of a first and a second electric field polar components orthogonal to each other and both oriented in a plane perpendicular to said axis of propagation; b) splitting the beam with the said first beam splitter into plane polarized distinct probe and reference beams; c) intersecting said probe beam with the test medium, and intersecting a selected beam among either one of said probe beam and said reference beam with the wave plate element, whereby the phase speed of the first polar of the selected beam is modified by N*π/2 radians, where N is any signed odd integer, relative to its second polar, by the wave plate element; d) merging, at said second non-polarizing beam splitter, said probe beam and said reference beam into a single output beam so as to produce interference between the first polar components of said probe beam and said reference beam and a distinct interference between the second polars of said probe beam and said reference beam; e) segregating said output beam according to its polarization with the polarizing beam splitter, wherein the first and second polar components of said output beam will be separated so as to allow distinct interferograms to be formed, whereby a quadrature interferogram will be formed from said first polar components and an in-phase interferogram will be formed from said second polar components; and f) recovering the images of the quadrature and in-phase interferograms with the image recovering means.

Claim 18

A method for optically probing a suitable substantially non-birefringent test medium of optically varying length and obtaining information about the properties thereof by recovering the images of quadrature and in-phase interferograms with an interferometric phase imaging apparatus comprising a plane polarized radiation source, a non-polarizing beam splitter, a polarizing beam splitter, at least one reflective element, a wave plate element and imaging recovering means, said method comprising the steps of: a) providing a plane polarized source beam with the radiation source along an axis of propagation, whereby the source beam is polarized along a polarizing axis, the electric field of said beam being vectorially composed of a first and a second electric field polar components orthogonal to each other and of equal magnitude and both oriented in a plane perpendicular to said axis of propagation; b) splitting the beam with the said non-polarizing beam splitter into plane polarized distinct probe and reference beams; c) intersecting said probe beam with the test medium, and intersecting a selected beam among either one of said probe beam and said reference beam with the wave plate element, whereby the phase speed of the first polar of the selected beam is modified by N*π/2 radians, where N is any odd signed integer, relative to its second polar, by the wave plate element; d) intersecting with said at least one reflective element at least either one of said probe beam and said reference beam, whereby said probe beam and said reference beam are redirected to said non-polarizing beam splitter; e) merging, at said second non-polarizing beam splitter, said probe beam and said reference beam into a single output beam so as to produce interference between the first polar components of said probe beam and said reference beam and a distinct interference between the second polars of said probe beam and said reference beam; wherein said modified phase speed applies at said output beam, after the beam has passed twice through said wave plate element, and downstream of said wave plate element and upstream of and at the first mentioned beam splitter; f) further including the step of segregating said output beam according to its polarization with the polarizing beam splitter, wherein the first and second polar components of said output beam will be separated so as to allow distinct interferograms to be formed, whereby a quadrature interferogram will be formed from said first polar components and an in-phase interferogram will be recovered from said second polar components; and g) recovering the images of the quadrature and in-phase interferograms with the image recovering means.

Claim 19

A method for optically probing a suitable substantially non-birefringent test medium of optically varying length and obtaining information about the properties thereof by recovering the images of quadrature and in-phase interferograms with an interferometric phase imaging apparatus comprising a plane polarized radiation source, a non-polarizing beam splitter, a polarizing beam splitter, at least one reflective element, a wave plate element and imaging recovering means, said method comprising the steps of: a) providing a plane polarized source beam with the radiation source along an axis of propagation, whereby the source beam is polarized along a polarizing axis, the electric field of said beam being vectorially composed of a first and a second electric field polar components orthogonal to each other and of equal magnitude and both oriented in a plane perpendicular to said axis of propagation; b) splitting the beam with the said non-polarizing beam splitter into plane polarized distinct probe and reference beams; c) intersecting said probe beam with the test medium, and intersecting a selected beam among either one of said probe beam and said reference beam with the wave plate element, whereby the phase speed of the first polar of the selected beam is modified by N*π/2 radians, where N is any odd signed integer, relative to its second polar, by the wave plate element; d) intersecting with said at least one reflective element at least either one of said probe beam and said reference beam, whereby said probe beam and said reference beam are redirected to said non-polarizing beam splitter; e) merging, at said second non-polarizing beam splitter, said probe beam and said reference beam into a single output beam so as to produce interference between the first polar components of said probe beam and said reference beam and a distinct interference between the second polars of said probe beam and said reference beam; wherein said modified phase speed applies at said output beam, after the beam has passed twice through said wave plate element, and downstream of said wave plate element and upstream of and at the first mentioned beam splitter; f) further including the step of segregating said output beam according to its polarization with the polarizing beam splitter, wherein the first and second polar components of said output beam will be separated so as to allow distinct interferograms to be formed, whereby a quadrature interferogram will be formed from said first polar components and an in-phase interferogram will be recovered from said second polar components; and g) recovering the images of the quadrature and in-phase interferograms with the image recovering means.