Waveform quality measuring method and apparatus

Claim 2

A waveform quality measuring method in which an input signal is converted to a digital signal, said digital signal is converted to a first complex base band signal, an error parameter in said first complex base band signal is corrected to obtain a corrected complex base band signal, and said corrected complex base band signal and a reference signal are used to measure the waveform quality of said input signal, said method comprising: (a) a time reference extracting/frequency error estimating step of synchronizing said first complex base band signal and a local code sequence to obtain a first signal delay value and a first frequency error; (b) a first correcting step of correcting said first complex base band signal based on said first frequency error to obtain a second complex base band signal; (c) an initial phase estimating step of estimating a first initial phase of a carrier from said second complex base band signal; (d) a second correcting step of correcting said second complex base band signal based on said first initial phase to obtain a third complex base band signal; (e) a symbol point estimating step of calculating a second signal delay value, which is a time lag between a symbol point and a sample point nearest thereto, from said third complex base band signal, said first signal delay value and said local code sequence; (f) a reference signal generating step of generating a reference signal, which has a time lag of said second signal delay value relative to said sample point, from said first signal delay value, said second signal delay value and said local code sequence; (g) a frequency/initial phase estimating step of estimating a second frequency error and a second initial phase of said carrier from said reference signal and said third complex base band signal; and (h) a third correcting step of correcting said first complex base band signal based on said first and second frequency errors and said first and second initial phases of said carrier to obtain said corrected complex base band signal.

Claim 3

The method of claim 1, wherein said time reference extracting/frequency error estimating step, said first and second correcting steps, said initial phase estimating step and said symbol point estimating step are executed using that one portion of said first complex base band signal which has a data length shorter than that necessary for waveform quality measurement.

Claim 4

The method of claim 1, wherein the process of synchronizing said first complex base band signal and said local code sequence in said step (a) comprises the steps of: (a1) dividing said first complex base band signal into n partial signals each having a predetermined number of samples, said n being an integer equal to or greater than 2; (a2) dividing said local code sequence into partial code sequences each having a sequence length of N chips, said N being an integer equal to or greater than 2; (a3) extracting a first one of said partial signals of said partial signal sequence and a first one of said partial code sequences; (a4) calculating the value of correlation between said extracted partial signal and said exacted partial code sequence; (a5) deciding whether or not said correlation value exceeds a threshold value; (a6) accumulating said correlation value when it is decided in said step (a5) that said correlation value exceeds said threshold value; (a7) deciding whether or not said calculation has been conducted for all of said n partial signals; (a8) extracting the next partial signal and the next partial code sequence and returns to said step (a4) when it is decided in said step (a7) that said calculation has not been conducted for all of said n partial signals; (a9) making a check to see if said accumulated value is larger than the maximum value so far when it is decided in said step (a7) that said calculation has been conducted for all of said n partial signals; (a10) displacing the phase of said local code sequence by one chip and resetting said accumulated value when it is decided in said step (a9) that said accumulated value is not larger than said maximum value; (a11) when it is decided in said step (a9) that said accumulated value is larger than said maximum value, setting said accumulated value as the maximum value, recording the positions of said local code sequence and said first complex base band signal at that time and proceeding to said step (a10); (a12) making a check after said step (a10) to see if a search has been completed over a predetermined range, and if not, returning to said step (a2); and (a13) when it is decided in said step (a12) that said search has been completed over said predetermined range, deciding that synchronization has been established between said first complex base band signal and said local code sequence, if said maximum value is positive, and setting said recorded positions of said input signal and said local code sequence as the positions of their synchronization.

Claim 5

The method of claim 3, wherein said first complex base band signal is a signal sampled at a rate R times higher than the chip rate, R being an integer equal to or greater than 2; and wherein: in said step (a4), the values of correlation are calculated between N samples extracted from said extracted partial signals every R samples, starting at u-th sample and N chips of said extracted partial code sequence; when it is decided in said step (a12), that said search has been completed over said predetermined range, the phase of said first complex base band signal by one sample; a check is made in said step (a15) to see if said search has been completed over said predetermined range from first to R-th samples of said partial signal, and if not, said synchronizing process return to said step (a1), and if completed, said process proceeds to said step (a13).

Claim 6

The method of claim 1, wherein said code sequence is a PN code sequence.

Claim 7

A waveform quality measuring apparatus in which an input signal is converted to a digital signal, said digital signal is converted to a first complex base band signal, an error parameter in said first complex base band signal is corrected to obtain a corrected complex base band signal, and said corrected complex base band signal and a reference signal are used to measure the waveform quality of said input signal, said apparatus comprising: time reference extracting/frequency error estimating means for synchronizing said first complex base band signal and a local code sequence to obtain a first signal delay value and a first frequency error; frequency correcting means for correcting said first complex base band signal based on the first frequency error to obtain a second complex base band signal; initial phase estimating means for estimating a first initial phase of a carrier from said second complex base band signal; phase correcting means for correcting said second complex base band signal based on said first initial phase to obtain a third complex base band signal; symbol point estimating means for estimating a second signal delay value, which is a time lag between a symbol point and a sample point nearest thereto, from said third complex base band signal, said first signal delay value and said local code sequence; reference signal generating means for a reference signal, which has a time lag of said second signal delay value relative to said sample point, from said first signal delay value, said second signal delay value and said local code sequence; frequency/initial phase estimating means for estimating a second frequency error and a second initial phase of said carrier from said reference signal and said third complex base band signal; and frequency error/initial phase correcting means for correcting said first complex base band signal based on said first and second frequency errors and said first and second initial phases to obtain said corrected complex base band. signal.

Claim 8

A waveform quality measuring apparatus in which an input signal is converted to a digital signal, said digital signal is converted to a first complex base band signal, an error parameter in said first complex base band signal is corrected to obtain a corrected complex base band signal, and said corrected complex base band signal and a reference signal are used to measure the waveform quality of said input signal, said apparatus comprising: time reference extracting/frequency error estimating means for synchronizing said first complex base band signal and a local code sequence to obtain a first signal delay value and a first frequency error; frequency correcting means for correcting said first complex base band signal based on the first frequency error to obtain a second complex base band signal; initial phase estimating means for estimating a first initial phase of a carrier from said second complex base band signal; phase correcting means for correcting said second complex base band signal based on said first initial phase to obtain a third complex base band signal; symbol point estimating means for estimating a second signal delay value, which is a time lag between a symbol point and a sample point nearest thereto, from said third complex base band signal, said first signal delay value and said local code sequence; reference signal generating means for a reference signal, which has a time lag of said second signal delay value relative to said sample point, from said first signal delay value, said second signal delay value and said local code sequence; frequency/initial phase estimating means for estimating a second frequency error and a second initial phase of said carrier from said reference signal and said third complex base band signal; and frequency error/initial phase correcting means for correcting said first complex base band signal based on said first and second frequency errors and said first and second initial phases to obtain said corrected complex base band. signal.